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MIL-PRF-19500-260 Semiconductor Device, Diode, Silicon, Power Rectifier, Types 1N1202A, 1N1204A, 1N1206A, 1N3671A, 1N3673A, And Ar Versions, Jan, Jantx, Jantxv, Jans, Janhc, And Jankc, 1N1124A, 1N1126A, 1N1128A, 1N3649, 1N3650, 1N1124Ra, 1N1126Ra, 1N1128Ra , 1N3649R, And 1N3650R, Jan OnlyThis specification covers the performance requirements for silicon semiconductor power rectifier diodes. Four levels of product assurance are provided for each encapsulated 1N1202A, 1N1204A, 1N1206A, 1N3671A, 1N3673A device type as specified in MIL-PRF-19500, and two levels of product assurance for each unencapsulated device type. One level of product assurance is provided for each device type as specified in MIL-PRF-19500, for the 1N1124A, 1N1126A, 1N1128A, 1N3649, 1N3650. For normal and reverse \(A, R, RA, and AR suffix\) type devices see 3.4.1.

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MIL-PRF-19500/260L
* 4.4.2.2 Group B inspection, appendix E, table E-VIb (JAN, JANTX and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Condition
-55°C to +175°C, 25 cycles.
B2
1051
Condition A, TC = 150°C; VR = rated VR (ac peak) (see 1.3), If (surge) = 240 A;
B2
4066
IO = 12 A dc; six 1/120 s surges. 1 minute minimum time between surges. tp =
8.3 ms.
or
Test condition C; TA = TC = TJ = 200°C; VR = rated VR (ac peak) (see 1.3), IO =
0, IFSM (surge) = 240 A, six 1/120s surges. 1 minute minimum time between
surges. tp = 8.3 ms.
B3
1037
0.25 rated IO < IO applied < rated IO (see 4.5.3) 2,000 cycles.
B3
1038
Condition A; 340 hrs. (Separate samples maybe used.)
or
1049
B5
Not required.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VII of MIL-PRF-19500 and as follows. Electrical measurements (end-points)
shall be in accordance with table I, subgroup 2 herein. Delta measurements shall be in accordance with table III
herein.
4.4.3.1 Group C inspection, appendix E, table E-VII of MIL-PRF-19500.
Subgroup
Method
Condition
C2
1056
Test condition B.
C2
2036
Test condition A, weight = 10 pounds, t = 15 s.
C2
2036
Test condition F, method B, weight = 5 pounds, t = 15 s.
C2
2036
Test condition D1, seal torque = 10 ounce-inches, t = 15 s.
C2
2036
Test condition D2, stud torque = 15 pound-inches, t = 15 s.
RθJC = 2.0°C/W maximum; IM = 50 ­ 250 mA; IH ≥ rated IO; tH ≥ 15s;
C5
3101
tMD = 50 to 300 µs.
0.25 rated IO ≤ IO applied ≤ rated IO (see 4.5.3) 6,000 cycles.
C6
1037
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-IX of MIL-PRF-19500. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein. Delta measurements shall be in accordance with table III herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
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