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MIL-PRF-19500-260 Semiconductor Device, Diode, Silicon, Power Rectifier, Types 1N1202A, 1N1204A, 1N1206A, 1N3671A, 1N3673A, And Ar Versions, Jan, Jantx, Jantxv, Jans, Janhc, And Jankc, 1N1124A, 1N1126A, 1N1128A, 1N3649, 1N3650, 1N1124Ra, 1N1126Ra, 1N1128Ra , 1N3649R, And 1N3650R, Jan OnlyThis specification covers the performance requirements for silicon semiconductor power rectifier diodes. Four levels of product assurance are provided for each encapsulated 1N1202A, 1N1204A, 1N1206A, 1N3671A, 1N3673A device type as specified in MIL-PRF-19500, and two levels of product assurance for each unencapsulated device type. One level of product assurance is provided for each device type as specified in MIL-PRF-19500, for the 1N1124A, 1N1126A, 1N1128A, 1N3649, 1N3650. For normal and reverse \(A, R, RA, and AR suffix\) type devices see 3.4.1.

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MIL-PRF-19500/260L
4.3.2 Thermal impedance The thermal impedance measurements shall be performed in accordance with method
3101 of MIL-STD-750. The thermal impedance conditions and maximum thermal impedance limit shall be derived by
each vendor. The chosen thermal impedance measurement and conditions for each device in the qualification lot
shall be submitted in the qualification report and a thermal impedance curve shall be plotted. The chosen thermal
impedance values shall be considered final after the manufacturer has had the opportunity to test five consecutive
lots. Heating current (IH) ≥ rated IO; tH = 150 to 400 ms; tMD = 50 to 300 µs; 50 mA ≤ IM ≤` 250 mA.
4.3.3 Power burn-in. Power burn-in conditions are as follows: method 1038 of MIL-STD-750, test condition B.
TC = 150°C, f = 60 Hz, IO = 12 A dc (see 4.5.2); VR = rated VRWM (pk) (see 1.3).
4.3.4 Screening (JANHC and JANKC). Screening of JANHC and JANKC die shall be in accordance with
MIL-PRF-19500. As a minimum, die shall be 100-percent probed to ensure compliance with IR1 of table I,
subgroup 2.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and
table I herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E,table E-VIa (JANS) and table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500
and 4.4.2.1 and 4.4.2.2 herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2
herein. Delta measurements shall be in accordance with table III herein.
* 4.4.2.1 Group B inspection, appendix E, table E-VIa (JANS) of MIL-PRF-19500.
Method
Condition
Subgroup
-55°C to +175°C, 100 cycles.
B3
1051
Condition A, TC = 150°C; VR = (rated VR) AC peak (see 1.3), IFSM (surge) = 240
B3
4066
A; IO = 12 A dc; six surges 1/120 s, tP = 8.3 mS, one minute minimum time
between surges.
B4
1037
0.25 rated IO < IO applied < rated IO (see 4.5.3) 2,000 cycles.
IF = 4 A dc; VR = rated VR (see 1.3), TA = 125°C; or adjusted as required to
B5
1027
achieve TJ = 275°C minimum (see 4.5.2), f = 60 Hz t = 1,000 hours.
Option 1: TA = + 30°C max. ; TJ = 225°C minimum; t = 216 hours; n = 45
c = 0.
Option 2: TA = + 100°C max. ; TJ = 275°C minimum; t = 96 hours, n = 22,
or
c = 0.
7



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