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MIL-PRF-19500-286 Semiconductor Device, Diode, Silicon, Power Rectifier, Types 1N4245 Through 1N4249, Jan, Jantx, Jantxv, And JanhcThis specification covers the performance requirements for silicon, power rectifier, medium-recovery diodes. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/286K
TABLE III. Groups A, B, C, and E delta measurements. 1/ 2/ 3/ 4/
Step
Inspection
Symbol
Limits
Unit
Method
Conditions
Min
Max
ĆVF2
1.
Forward voltage
4011
IF = 3.0 A dc pulse width =
�0.1 V dc
8.3 ms maximum, duty
maximum
cycle = 2 percent maximum.
ĆIR1
2.
Reverse current
4016
DC method; VR = rated
�50 nA dc or �100
(see 1.3).
percent of initial value,
whichever is greater.
Devices that exceed the table I, subgroup 2 limits for this test shall not be accepted.
1/
2/
The delta measurements for group B inspection in table E-VIB (JAN and JANTX) of
MIL-PRF-19500 are as follows: Subgroup 3 and 6, see table III herein, steps 1 and 2.
3/
The delta measurements for group C inspection in table E-VII of MIL-PRF-19500 are as follows: Subgroup 6,
see table III herein, steps 1 and 2.
4/
The delta measurements for group E inspection in table E-IX of MIL-PRF-19500 are as follows:
a. Subgroup 1, see table III herein, steps 1 and 2.
b. Subgroup 2, see table III herein, steps 1 and 2.
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