MIL-PRF-19500/286K
4.3 Screening (JANTX, and JANTXV levels only). Screening shall be in accordance with table E-IV of
MIL-PRF-19500 and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Measurement
Screen (see appendix E,
table E-IV of
JANTX and JANTXV levels
(1) 3c
See 4.3.2
7a
Not applicable
7b
Optional
9
Not applicable
10
Method 1038 of MIL-STD-750, condition A
11
IR1 and VF1
12
See 4.3.1
(2) 13
percent of initial values or ±100 nA dc, whichever is greater.
Scope display evaluation (see 4.5.3)
14a
Not applicable
(3) 14b
Required
(1) Shall be performed anytime after temperature cycling, screen 3a, and does not need to be repeated in
screening requirements.
(2) Thermal impedance is not required in screen 13, if it has already previously performed.
(3) For clear glass diodes, the hermetic seal (gross leak) may be performed at anytime after temperature cycling.
4.3.1 Power burn-in conditions. Power burn-in conditions are as follows (see 4.5.2): IO(min) = Rated IO (see 1.3
herein). TA = 55°C maximum. Test conditions in accordance with method 1038 of MIL-STD-750, condition B. Adjust
IO or TA to achieve the required TJ. TJ = 135°C minimum. With approval of the qualifying activity and preparing
activity, alternate burn-in criteria (hours, bias conditions, TJ, mounting conditions) may be used for JANTX and
JANTXV quality levels. A justification demonstrating equivalence is required. In addition, the manufacturing site's
burn-in data and performance history will be essential criteria for burn-in modification approval.
4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with method
3101 or 4081 as applicable of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, and K
factor where appropriate. Measurement delay time (tMD) = 70 µs max. See table II, subgroup 4 herein. Thermal
impedance limit used by supplier shall not exceed the thermal impedance graph, see figure 3 herein.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I.
* 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500, and as follows. Electrical
measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
Subgroup
Method
Inspection
B2
4066
IFSM = 25 A (pk), ten surges of 1/120 s each at 1 minute intervals, super-
I0 = 1.0 A dc minimum; TA = +55°C (max.); TJ = +150°C minimum; f = 50 - 60
B3
1027
6
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