MIL-PRF-19500/313J
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of
MIL-STD-750.
4.5.2 Emitter to collector cutoff current. Method of test shall be in accordance with method 3041 of MIL-STD-750,
test condition C, except that all references to the collector and emitter of the transistor under test shall be
interchanged.
4.5.3 Emitter to collector breakdown voltage. Method of test shall be in accordance with method 3011 of
MIL-STD-750, test condition D, except that all references to the collector and emitter of the transistor under test shall
be interchanged.
4.5.4 Forward current transfer ratio (inverted connection). Method of test shall be in accordance with method
3076 of MIL-STD-750, except that all references to the collector and emitter of the transistor under test shall be
interchanged. Then hFE(inv ) = I E /I B.
4.5.5 Emitter to collector offset voltage. The transistor shall be tested in the circuit on figure 10. The base
current shall be adjusted to the specified value. The voltage between the emitter and collector shall be measured
using a voltmeter with an input impedance high enough that halving it does not change the measured value within the
required accuracy of the measurement.
4.5.6 Small signal emitter to collector on-state resistance. The transistor shall be tested in the circuit of figure 11.
The base current shall be adjusted to the specified value and an ac sinusoidal signal current, Ie, of the specified rms
value shall be applied between the emitter and collector. The rms voltage, Vec, between the emitter and collector
shall be measured using an ac voltmeter with an input impedance high enough that halving it does not change the
measured value within the required accuracy of the measurement. The small signal emitter to collector on-state
resistance shall then be determined as follows:
rec(on) = Vec /IE
Where Vec is the rms voltage between the emitter and collector.
*
4.5.7 Delta requirements. Delta requirements shall be as specified below: (1) (2) (3) (4)
Step
Inspection
MIL-STD-750
Symbol
Limit
Unit
Method
Conditions
ĆICB02
1
Collector-base cutoff
3036
Bias condition D
100 percent of initial value or
current
5 nA dc, whichever is greater.
2N2432, 2N2432UB
VCB = 25 V dc
2N2432A, 2N2432AUB
VCB = 40 V dc
±25 percent change from
ĆhFE2
2
Forward current transfer
3076
VCE = 5 V dc;
ratio
initial reading.
IC = 1.0 mA dc;
pulsed see 4.5.1
(1) Devices which exceed the table I limits for this test shall not be accepted.
(2) The delta measurements for group B, table E-VIa (JANS) of MIL-PRF-19500 are as follows:
Subgroup 3 and 5; see 4.5.7 herein, steps 1 and 2.
(3) The delta measurements for 4.4.2.2 herein (group B, JAN, JANTX, and JANTXV) are as follows: Steps 1
and 2 of 4.5.7 shall be performed after each step in 4.4.2.2 herein.
(4) The delta measurements for group C, table E-VII of MIL-PRF-19500 are as follows: Subgroup 6, see 4.5.7
herein, steps 1 and 2 for JANS only.
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