MIL-PRF-19500/313J
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 3 - Continued
200
nA dc
Emitter to collector cutoff current
3041
IECS2
Bias condition C; VEC = 15 V dc;
VBC = 0 (see 4.5.2)
TA = -55°C
Low-temperature operation:
VCE = 5 V dc; IC = 10 µA dc;
Forward-current transfer ratio
3076
10
hFE3
pulsed (see 4.5.1)
Forward-current transfer ratio
3076
25
VCE = 5 V dc; IC = 1 mA dc;
hFE4
pulsed (see 4.5.1)
VCE = 5 V dc; IE = 200 µA dc;
Forward-current transfer ratio
3076
1.8
hFE(inv)2
(inverted connection)
pulsed (see 4.5.1 and 4.5.4)
Subgroup 4
Small signal emitter collector on state
rec(on)
IB = 1 mA dc; IE = 0;
resistance
Ie = 100 µA ac (rms); f = 1 kHz
(see 4.5.6 and figure 10)
Ω
2N2432, 2N2432UB
20
Ω
2N2432A, 2N2432AUB
15
Small-signal short-circuit forward-
3306
2
10
VCE = 5 V dc; IC = 1 mA dc;
|hfe |
current transfer ratio
f = 20 MHz
Open circuit output capacitance
3236
12.0
pF
VCB = 0; IE = 0;
Cobo
100 kHz ≤ f ≤ 1 MHz
Input capacitance
3240
12.0
pF
VEB = 0 V dc; IC = 0;
Cibo
100 kHz ≤ f ≤ 1 MHz
Subgroups 5, 6, and 7
Not applicable
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed subgroup 1 of table I, double the sample size of the failed test or sequence of
tests. A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall
be rerun upon submission.
3/ Separate samples may be used.
4/ Not applicable for JANS devices.
5/ Not required for laser marked devices.
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