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MIL-PRF-19500-356 Semiconductor Device, Diode, Silicon, Voltage Regulator, Types 1N4954 Through 1N4996, 1N5968, 1N5969,And 1N6632 Through 1N6637, 1N4954Us Through 1N4996Us, 1N5968Us, 1N5969Us, And 1N6632Us Through 1N6637Us, And C And D Tolerance Suffix Devices, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for silicon, voltage regulator diodes. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance for each unencapsulated device type die.

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MIL-PRF-19500/356L

TABLE I. Group A inspection.

MIL-STD-750

Limits

Inspection 1/

Symbol

Unit

Method

Conditions

Min

Max

Subgroup 1

Visual and mechanical

2071

inspection

Subgroup 2

�C/W

ZθJX

Thermal impedance

3101

See 4.3.1.

1N4954 through

1.8

1N4996

1N5968, 1N5969

3.0

1N6632 through

3.0

1N6637

Forward voltage

4011

IF = 1 A dc.

1.5

V dc

�A dc

Reverse current

4016

DC method; VR = column 11 of

IR1

Column

12 of

table IV herein.

table IV

Regulator voltage

4022

IZ = column 5 of table IV herein;

Column

V dc

3 of

4 of

0.2 ms ≤ tp ≤ 300 ms. (pulsed)

table IV

(see 4.5.1 and 4.5.2)

Subgroup 3

TA = +150�C.

High temperature

operation:

�A dc

Reverse current

4016

DC method; VR = column 11 of

IR2

Column

14 of

table IV herein; pulsed (see 4.5.1).

table IV

Subgroup 4

Small-signal reverse

4051

IZ = column 5 of table IV herein;

Column

ohms

breakdown impedance

6 of

Isig = 10 percent of IZ.

table IV

Knee impedance

4051

IZK =column 14 of table IV

ZZK

Column

ohms

7 of

herein; Isig = 10 percent of IZK

table IV

Scope display

4023

See 4.5.6.

See footnotes at end of table.