MIL-PRF-19500/357M
* TABLE I. Group A inspection.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 1 2/
Visual and mechanical
2071
inspection 3/
Solderability 3/ 4/
2026
n = 15 leads, c = 0
Resistance to solvents
1022
n = 15 devices, c = 0
3/ 4/ 5/
Temp cycling 3/ 4/
1051
Test condition C, 25 cycles. n = 22 devices,
c=0
Hermetic seal 4/
1071
n = 22 devices, c = 0
Fine leak
Gross leak
Electrical measurements 4/
Table I, subgroup 2
Decap internal visual (design
2075
n = 4 device, c = 0
verification)
Subgroup 2
°C/W
Thermal impedance
3131
See 4.3.3.
ZθJX
Collector to base, cutoff
3036
Bias condition D
current
µA dc
2N3634, 2N3634L, UB, UBN
10
VCB = 140 V dc
ICBO1
µA dc
2N3635, 2N3635L, UB, UBN
10
VCB = 140 V dc
ICBO1
µA dc
2N3636, 2N3636L, UB, UBN
10
VCB = 175 V dc
ICBO1
µA dc
2N3637, 2N3637L, UB, UBN
10
VCB = 175 V dc
ICBO1
µA dc
Emitter to base, cutoff current
3061
10
Bias condition D, VEB = 5 V dc
IEBO1
Breakdown voltage, collector
3011
Bias condition D, IC = 10 mA dc pulsed
V(BR)CEO
to emitter
(see 4.5.1)
2N3634, 2N3634L, UB, UBN
140
V dc
2N3635, 2N3635L, UB, UBN
2N3636, 2N3636L, UB, UBN
175
V dc
2N3637, 2N3637L, UB, UBN
See footnotes at end of table.
13
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