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MIL-PRF-19500-357 Semiconductor Device, Transistor, Pnp, Silicon, Amplifier, Types 2N3634 Through 2N3637, 2N3634Ub Through 2N3637Ub, 2N3634Ubn Through 2N3637Ubn, 2N3634L Through 2N3637L, Jan, Jantx, Jantxv, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhca, Jankca, Jankcam, Jankcad, Jankcap, Jankcal, Jankcar, Jankcaf, Jankcag, Jankcah, Janhcb, Jankcb, Jankcbm, Jankcbd,...This specification covers the performance requirements for PNP, silicon, low-power amplifier, and switching transistors. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500 and two levels of product assurance are provided for unencapsulated devices. RHA level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

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MIL-PRF-19500/357M
1.4 Primary electrical characteristics. Unless otherwise specified, TA = +25°C.
hFE at VCE = 10 V dc
|hfe|
Cobo
Types
hFE1
hFE2
hFE3
hFE4
hFE5
VCE = 30 V dc
VCB = 20 V dc
IC = 10
IC = 50
IC = 150
IC = 30 mA dc
IE = 0
IC = 0.1
IC = 1.0
100 Khz ≤ f ≤
mA dc
mA dc (1)
mA dc (1)
f = 100 Mhz
mA dc
mA dc
(1)
1 Mhz
(1)
(1)
Min
Min
Min
Min
Max
Min
Max
Min
Max
Max
2N3634, 2N3634L
25
45
50
50
150
30
1.5
8.0
10
2N3634UB and UBN
25
45
50
50
150
30
1.5
8.0
10
2N3635, 2N3635L
55
90
100
100
300
60
2.0
8.5
10
2N3635UB and UBN
55
90
100
100
300
60
2.0
8.5
10
2N3636, 2N3636L
25
45
50
50
150
30
1.5
8.0
10
2N3636UB and UBN
25
45
50
50
150
30
1.5
8.0
10
2N3637, 2N3637L
55
90
100
100
300
60
2.0
8.5
10
2N3637UB and UBN
55
90
100
100
300
60
2.0
8.5
10
Switching parameters
VCE(sat)1
VCE(sat)2
VBE(sat)1
VBE(sat)2
td
tr
ts
tf
IC = 10 mA dc
IC = 50 mA dc
IC = 10 mA dc
IC = 50 mA dc (1)
(1)
(1)
(1)
IB = 5 mA dc
IB = 1 mA dc
IB = 5 mA dc
IB = 1 mA dc
V dc
V dc
V dc
V dc
ns
ns
ns
ns
Minimum
0.65
Maximum
0.3
0.6
0.8
0.90
100
100
500
150
(1) Pulsed (see 4.5.1).
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This
section does not include documents cited in other sections of this specification or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this
specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-19500
-
Semiconductor Devices, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-750
-
Test Methods for Semiconductor Devices.
*  (Copies of these documents are available online at https://quicksearch.dla.mil or https://assist.dla.mil or from the
Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2



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