MIL-PRF-19500-392 Semiconductor Device, Transistor, Pnp, Silicon, Switching, Types 2N3485A And 2N3486A, Jan, Jantx, And JantxvThis specification covers the performance requirements for PNP silicon switching transistors. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/392J

* TABLE II. Group E inspection (all quality levels) - for qualification or re-qualification only.

Inspection

MIL-STD-750

Qualification

Method

Conditions

Subgroup 1

45 devices

c=0

1051

Test condition C, 500 cycles.

Temperature cycling

(air to air)

Hermetic seal

Fine leak

1071

Gross leak

Electrical measurements

See table I, subgroup 2 and 4.5.2 herein.

Subgroup 2

45 devices

c=0

1037

Intermittent life

Intermittent operation life : VCB = 10 V dc, 6,000 cycles.

Adjust device current, or power, to achieve a minimum

ĆTJ of +100�C.

Electrical measurements

See table I, subgroup 2 and 4.5.2 herein.

Subgroup 4

Thermal impedance curves

See table E-IX of MIL-PRF-19500, group E, subgroup 4.

Sample size

N/A

Subgroup 5

Not applicable

Subgroup 6

11 devices

ESD

1020

Subgroup 8

45 devices

c=0

Reverse stability

1033

Condition B.