MIL-PRF-19500/392J
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limit
Unit
Method
Conditions
Min
Max
Subgroup 4 - Continued.
Input capacitance (output
3240
30
pF
VEB = 2.0 V dc; IC = 0;
Cibo
open-circuited)
100 kHz ≤ f ≤ 1 MHz.
Turn-on time
(See figure 6)
45
ns
ton
Turn-off time
(See figure 7)
ns
toff
2N3485A
175
2N3486A
200
Pulse response (non-
(See figure 8)
18
ns
ton + toff
saturated)
Subgroup 5, 6, and 7
Not applicable
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed table I, subgroup 1, double the sample size of the failed test or sequence of tests. A
failure in group A, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun
upon submission.
3/ Separate samples may be used. Subgroup 1 may be performed simultaneously.
4/ Not required for laser marked devices.
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