MIL-PRF-19500/392J
4.4.3.2 Group C sample selection. Samples for subgroups in group C shall be chosen at random from any
inspection lot containing the intended package type and lead finish procured to the same specification which is
submitted to and passes table I tests for conformance inspection. Testing of a subgroup using a single device type
enclosed in the intended package type shall be considered as complying with the requirements for that subgroup.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified in table II herein. Electrical measurements (end-
points) and delta measurements shall be in accordance with the applicable steps of 4.5.2 and table I, subgroup 2
herein.
4.5 Method of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows:
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of
MIL-STD-750.
4.5.2 Delta requirements. Delta requirements shall be as specified below:
Step
Inspection
MIL-STD-750
Symbol
Limit
Method
Conditions
ĆICB02 (1)
1
Collector-base cutoff
3036
Bias condition D,
100 percent of initial
value or ±5 nA dc,
current
VCB = 50 V dc
whichever is greater.
±25 percent change
ĆhFE4 (1)
2
Forward current
3076
VCE = 10 V dc;
transfer ratio
from initial reading.
IC = 150 mA dc;
pulsed see 4.5.1
(1) Devices which exceed the table I limits for this test shall not be accepted.
7
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business