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MIL-PRF-19500-399 Semiconductor Device, Transistor, Npn, Silicon, Switching Type 2N3960 And 2N3960Ub Jan, Jantx, Jantxv, Jantxvm, Jantxvd, Jantxvp, Jantxvl, Jantxvr, Jantxvf, Jantxvg, Jantxvh, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhc, Janhcm, Janhcd, Janhcp, Janhcl, Janhcr, Janhcf, Janhcg, Janhch, Jankc, Jankcm, Jankcd, Jankcp, Jankcl, Jankcr, Jankcf, Jankcg, A...This specification covers the performance requirements for NPN silicon, switching transistors. Four levels of product assurance are provided for each device type and two levels for unencapsulated die as specified in MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type. RHA level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices which have passed RHA requirements.

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MIL-PRF-19500/399F
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 4 - continued.
VCE = 4 V dc; IC = 10 mA dc;
Magnitude of common emitter
3306
14
|hfe2|
small-signal short- circuit
f = 100 MHz
forward-current transfer ratio
VCE = 4 V dc; IC = 30 mA dc;
|hfe3|
Magnitude of common emitter
12
3306
small-signal short- circuit
f = 100 MHz
forward-current transfer ratio
VCB = 4 V dc; IE = 0;
Cobo
Open circuit output
3236
2.5
pF
capacitance
100 kHz ≤ f ≤ 1 MHz
Input capacitance (output
3240
2.5
pF
VEB = 0.5 V, IC = 0,
Cibo
open-circuited)
100 kHz ≤ f ≤ 1 MHz
Subgroups 5, 6, and 7
Not applicable
1/ For sampling plan, unless otherwise specified, see MIL-PRF-19500.
2/ For resubmission of failed subgroup A1, double the sample size of the failed test or sequence of tests. A failure in
group A, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon
submission.
3/ Separate samples may be used.
4/ Not required for JANS devices
5/ Not required for laser marked devices.
12



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