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MIL-PRF-19500-406 Semiconductor Devices, Diode, Silicon, Voltage Regulator, Types 1N4460, 1N4460C, 1N4460D Through 1N4496, 1N4496C, 1N4496D, And 1N6485, 1N6485C, 1N6485D Through 1N6491, 1N6491C, 1N6491D, 1N4460Us, 1N4460Cus, 1N4460Dus Through 1N4496Us, 1N4496Cus, 1N4496Dus, And 1N6485Us, 1N6485Cus, 1N6485Dus Through 1N6491Us, 1N6491Cus, 1N6491Dus, 1N4460Um Through 1N4496Um, Plus C And D ...This specification covers the performance requirements for micro-miniature 1.5 watt silicon, low leakage, voltage regulator diodes with tolerances of 5 percent, 2 percent, and 1 percent. Four levels of product assurance are provided for each encapsulated device type as specified in MIL–PRF–19500.

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MIL-PRF-19500/406L
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VII of MIL­PRF­19500 and herein. Electrical measurements (end-points)
shall be in accordance with the applicable inspections of table I, subgroup 2 herein. ZθJX is an end-point for these
subgroups: C2 and C6 (JAN, JANTX, and JANTXV product levels only).
4.4.3.1 Group C inspection, table E-VII of MIL­PRF­19500.
Subgroup
Method
Condition
C2
1056
0ºC to +100ºC, 15 cycles, n = 22, c = 0.
-55°C to +175°C, 25 cycles, n = 22, c = 0.
C2
1051
C2
1071
Fine leak and gross leak shall be performed for UM version devices. Test
condition E shall be performed for non-UM version devices. NOTE: For non-
transparent devices, hermetic seal may be performed after electrical
measurements.
Tension - test condition A; 10 lbs; t = 15 s ±3 s. Lead fatigue - Test condition E.
C2
2036
NOTE: Not applicable to US and UM versions.
*
C2
2038
US, URS devices - Tension: Condition A, 10 pounds, t = 15s.
RθJL and RθJEC see 1.3 and 4.3.2 herein.
C5
4081
C6
1026
IZ(min) = 50 percent of column 8 of table III minimum. Adjust IZ or TA to achieve
TJ = 150°C min (see 4.5.6).
C7
1018
Not applicable, except for UM package.
*
Temperature coefficient for JAN, JANTX, and JANTXV only; IZ = column 5 of
C8
4071
table III; TA1 = +25°C ±5°C; TA2 = +125°C ±5°C; limit = column 13 of table III (see
4.5.3), n = 22, c = 0.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL­PRF­19500 and as specified in table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein.
10



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