MIL-PRF-19500-406 Semiconductor Devices, Diode, Silicon, Voltage Regulator, Types 1N4460, 1N4460C, 1N4460D Through 1N4496, 1N4496C, 1N4496D, And 1N6485, 1N6485C, 1N6485D Through 1N6491, 1N6491C, 1N6491D, 1N4460Us, 1N4460Cus, 1N4460Dus Through 1N4496Us, 1N4496Cus, 1N4496Dus, And 1N6485Us, 1N6485Cus, 1N6485Dus Through 1N6491Us, 1N6491Cus, 1N6491Dus, 1N4460Um Through 1N4496Um, Plus C And D ...This specification covers the performance requirements for micro-miniature 1.5 watt silicon, low leakage, voltage regulator diodes with tolerances of 5 percent, 2 percent, and 1 percent. Four levels of product assurance are provided for each encapsulated device type as specified in MIL┬ûPRF┬û19500.

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MIL-PRF-19500/406L

3.8. Selection of tighter tolerance devices. The C and D suffix devices shall be selected from JAN, JANTX,

JANTXV, or JANS devices, which have successfully completed all applicable screening, and groups A, B, and C

testing as �5 percent tolerance devices. All sublots of C and D suffix devices shall pass table I, subgroup 2, at

tightened tolerances. Tighter tolerances for mounting clip temperature shall be maintained for reference purposes to

establish correlation. For C and D tolerance levels, TL = 25�C, +1�C, -3�C at .375 inch (9.53 mm) from body, or zero

inches for surface mount devices or equivalent.

3.9 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance

characteristics are as specified in 1.3, 1.4, table I and table II herein.

3.10 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table I herein.

3.11 Maximum and primary test ratings. Maximum and primary test ratings for voltage regulator diodes are specified

3.12 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and

shall be free from other defects that will affect life, serviceability, or appearance.

4. VERIFICATION

4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:

a. Qualification inspection (see 4.2).

b. Screening (see 4.3).

c. Conformance inspection (see 4.4).

4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL�PRF�19500, and as specified

herein.

4.2.1 Group E qualification. Group E inspection shall be performed for qualification or requalification only. In case

qualification was awarded to a prior revision of the specification sheet that did not request the performance of table II

tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on the first

inspection lot of this revision to maintain qualification.