MIL-PRF-19500-406 Semiconductor Devices, Diode, Silicon, Voltage Regulator, Types 1N4460, 1N4460C, 1N4460D Through 1N4496, 1N4496C, 1N4496D, And 1N6485, 1N6485C, 1N6485D Through 1N6491, 1N6491C, 1N6491D, 1N4460Us, 1N4460Cus, 1N4460Dus Through 1N4496Us, 1N4496Cus, 1N4496Dus, And 1N6485Us, 1N6485Cus, 1N6485Dus Through 1N6491Us, 1N6491Cus, 1N6491Dus, 1N4460Um Through 1N4496Um, Plus C And D ...This specification covers the performance requirements for micro-miniature 1.5 watt silicon, low leakage, voltage regulator diodes with tolerances of 5 percent, 2 percent, and 1 percent. Four levels of product assurance are provided for each encapsulated device type as specified in MIL┬ûPRF┬û19500.

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MIL-PRF-19500/406L

1.4 Primary electrical characteristics. Primary electrical characteristics are as shown in maximum and primary test

ratings (see 3.11) and as follows: 3.3 V dc ≤ VZ ≤ 200 V dc (nominal).

a. 1N4460D through 1N4496D and 1N6485D through 1N6491D are 1 percent voltage tolerance.

b. 1N4460C through 1N4496C and 1N6485C through 1N6491C are 2 percent voltage tolerance.

c. 1N4460 through 1N4496 and 1N6485 through 1N6491 are 5 percent voltage tolerance.

RθJL = 42�C/W (max) at L = .375 inch (9.52 mm) (non-surface mount).

RθJEC = 20�C/W (max) (surface mount).

For thermal impedance curves, see figures 9, 10, 11, 12 and 13.

RθJSP = 56�C/W (max) (UM surface mount).

2. APPLICABLE DOCUMENTS

2.1 General. The documents listed in this section are specified in sections 3 or 4 of this specification. This section

does not include documents cited in other sections of this specification or recommended for additional information or

as examples. While every effort has been made to ensure the completeness of this list, document users are

cautioned that they must meet all specified requirements of documents cited in sections 3 or 4 of this specification,

whether or not they are listed.

2.2 Government documents.

2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a

part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are

those cited in the solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATIONS

MIL�PRF�19500 - Semiconductor Devices, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL�STD�750 - Test Methods for Semiconductor Devices.

* (Copies of these documents are available online at https://quicksearch.dla.mil.)

2.3 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the

text of this document and the references cited herein, the text of this document takes precedence. Nothing in this

document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.