MIL-PRF-19500/426H
4.4.2.3 Group B sample selection. Samples selected from group B inspection shall meet all of the following
requirements:
a.
For JAN, JANTX, and JANTXV samples shall be selected randomly from a minimum of three wafers (or from
each wafer in the lot) from each wafer lot. For JANS, samples shall be selected from each inspection lot.
See MIL-PRF-19500.
b
Shall be chosen from an inspection lot that has been submitted to and passed group A, subgroup 2
conformance inspection. When the final lead finish is solder or any plating prone to oxidation at high
temperature, the samples for life test (subgroups B4 and B5 for JANS, and group B for JAN, JANTX, and
JANTXV) may be pulled prior to the application of final lead finish.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) and delta
requirements shall be in accordance with the steps of table III herein and as specified in the notes for table III.
Subgroup
Method
Condition
C2
2036
Test condition E; not applicable for UB devices.
For JANS only. 1,000 hours minimum, VCB = -10 V dc, power shall be applied
*
C6
1026
to achieve TJ = +150°C minimum using a minimum of PD = 100 percent of
n = 45 devices, c = 0.
4.4.3.3 Group C sample selection. Samples for subgroups in group C shall be chosen at random from any
inspection lot containing the intended package type and lead finish procured to the same specification which is
submitted to and passes group A tests for conformance inspection. When the final lead finish is solder or any plating
prone to oxidation at high temperature, the samples for C6 life test may be pulled prior to the application of final lead
finish. Testing of a subgroup using a single device type enclosed in the intended package type shall be considered as
complying with the requirements for that subgroup.
4.4.4 Group D inspection. Conformance inspection for hardness assured JANS and JANTXV types shall include
the group D tests specified in table II herein. These tests shall be performed as required in accordance with
MIL-PRF-19500 and method 1019 of MIL-STD-750 for total ionizing dose, or method 1017 of MIL-STD-750 for
neutron fluence, as applicable (see 6.2 herein), except group D, subgroup 2 may be performed separate from other
subgroups. Alternate package options may also be substituted for the testing provided there is no adverse effect to
the fluence profile.
4.4.5 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified in table IV herein. Electrical measurements (end-
points) and delta requirements shall be in accordance with table III herein as specified in the footnotes for table III.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
4.5.2 Collector-base time constant. This parameter may be determined by applying an RF signal voltage of 1 volt
(rms) across the collector-base terminals and measuring the ac voltage drop (Veb) with a high impedance RF
voltmeter across the emitter-base terminals. With f = 63.6 MHz used for the 1 volt signal, the following computation
applies: Cc (ps) = 2 x Veb (millivolts).
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