MIL-PRF-19500/426H
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limit
Unit
Method
Conditions
Min
Max
Subgroup 3
TC = +150°C
High temperature
operation:
µA dc
Collector to base cutoff
3036
-100
ICB03
Bias condition D; VCE = -20 V dc,
current
IE = 0
TA = -55°C
Low temperature
operation:
Forward-current transfer
3076
10
hFE4
VCE = -10 V dc; IC = -5 mA dc;
ratio
Subgroup 4
3306
12
36
|hfe|
VCE = -10 V dc; IE = -2.0 mA dc;
Magnitude of common-
emitter small-signal short-
f = 100 MHz; case lead grounded
circuit forward-current
transfer ratio
Collector to base feedback
3236
0.8
pF
Ccb
VCB = -10 V dc; IE = 0;
capacitance
100 kHz ≤ f ≤ 1 MHz; case and
emitter leads shall be grounded
Collector to base time
3236
rb'Cc
1.0
8.0
ps
VCB = -10 V dc; IE = -2.0 mA dc;
constant
f = 63.6 MHz; case and emitter leads
(2N4957 only)
shall be grounded (see 4.5.2 and
figure 4)
Collector to base time
3236
rb'Cc
1.0
16.0
ps
VCB = -10 V dc; IE = -2.0 mA dc;
constant
f = 63.6 MHz; case and emitter leads
(2N4957UB only)
shall be grounded (see 4.5.2 and
figure 4)
Noise figure
3246
NF
3.5
dB
VCE = -10 V dc; IC = -2.0 mA dc;
f = 450 MHz; RL = 50 Ω; case lead
shall be grounded (see figure 5)
Common-emitter small
3256
GPE
17
25
dB
VCE = -10 V dc; IC = -2.0 mA dc;
signal power gain
f = 450 MHz; case lead shall be
grounded (see figure 5)
Subgroups 5, 6, and 7
Not applicable
1/ For sampling plan (unless otherwise specified), see MIL-PRF-19500.
2/ For resubmission of failed group A, subgroup 1, double the sample size of the failed test or sequence of tests. A
failure in group A, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun
upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
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