MIL-PRF-19500-426 Semiconductor Device, Transistor, Pnp, Silicon, Amplifier Type 2N4957 And 2N4957Ub, Jan, Jantx, Jantxv, Jantxvm, Jantxvd, Jantxvp, Jantxvl, Jantxvr, Jantxvf, Jantxvg, Jantxvh, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhc, Janhcm, Janhcd, Janhcp, Janhcl, Janhcr, Janhcf, Janhcg, Janhch, Jankc, Jankcm, Jankcd, Jankcp, Jankcl, Jankcr, Jankcf, Jankcg, ...This specification covers the performance requirements for PNP silicon, VHF-UHF amplifier transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type. Radiation hardness assurance \(RHA\) level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices which have passed RHA requirements.

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MIL-PRF-19500/426H

* TABLE III. Groups B, C, and E delta end-point inspection measurements. 1/ 2/ 3/ 4/

Step

Inspection

MIL-STD-750

Symbol

Limits

Unit

Method

Conditions

Min

Max

ĆICB01

�100 percent of initial

Collector to base

3036

Bias condition D;

cutoff current

VCB = -20 V dc, IE = 0

value or 10 nA dc,

whichever is greater.

ĆhFE3

�20 percent change

Forward current

3076

IC = -5 mA dc,

transfer ratio

from initial reading.

VCE = -10 V dc

The delta measurements for table VIA (JANS) of MIL-PRF-19500 are subgroup 4 and 5, see table III herein, all

steps.

The delta measurements for group B of 4.4.2.2 herein (JAN, JANTX, and JANTXV) are: Step 1, 2, and 3 of

4.4.2.2, see table III herein, all steps.

The delta measurements for table E-VII of MIL-PRF-19500, subgroup 6, all steps for JANS only:

The delta measurements for table E-IX of MIL-PRF-19500 are: Subgroups 1 and 2, see table III herein, all steps.