444\)This specification covers the performance requirements for Schottky barrier diodes. Five levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Two level of product assurance are provided for each unencapsulated device type.

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MIL-PRF-19500/445D

TABLE II. Group E inspections (all quality levels) for qualification only.

Sampling

Inspection 1/

MIL-STD-750

plan

Method

Conditions

22 devices

Subgroup 1

c=0

1051

500 cycles

Thermal shock

(temperature cycling)

Electrical measurements

See table I, group A, subgroup 2

(VF1 and IR1)

Subgroup 2

22 devices

c=0

Steady-state dc blocking life

1038

See 4.3.1, 1000 hrs

Electrical measurements

See table I, group A, subgroup 2

(VF1 and IR1)

Subgroup 3

Not applicable

22 devices

Subgroup 4

c=0

Thermal resistance

3101

RθJEC = 100�C/W (maximum) at zero

surface mount

lead length. +25�C ≤ TR ≤ +35�C,

4081

(see 4.5.4) at TH ≥ 25 s.

Thermal resistance

3101

For type 1N5712: RθJL = 700�C/W

leaded

(maximum); For type 1N5712-1:

4081

RθJL = 250�C/W (maximum) at .375

inches (9.52 mm) lead length

+25�C ≤ TR ≤ +35�C, (see 4.5.4)

at TH ≥ 25 s in still air.

Subgroup 5

Not applicable

3 devices

Subgroup 6

ESD testing

1020

1/ For sampling plan, see MIL-PRF-19500.