444\)This specification covers the performance requirements for Schottky barrier diodes. Five levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Two level of product assurance are provided for each unencapsulated device type.

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MIL-PRF-19500/445D

3.4.1 UR devices. "UR" devices shall be marked with a cathode band only. Initial container package marking will be in accordance

with MIL-PRF-19500.

3.5 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as

specified in 1.3, 1.4, and table I.

3.6 Electrical test requirements. The electrical test requirements shall be the subgroups specified in 4.4.2, 4.4.3, and table I.

3.7 Qualification. Devices furnished under this specification shall be products that are authorized by the qualifying activity for listing

on the applicable qualified manufacturers list before contract award (see 4.2 and 6.6 ).

4. VERIFICATION

4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:

Qualification inspection (see 4.2).

Screening (see 4.3)

Conformance inspection (see 4.3).

4.1.1 Sampling inspection. Sampling inspection shall be in accordance with MIL-PRF-19500 and as specified herein, except that lot

accumulation period shall be 6 months in lieu of 6 weeks.

4.2

Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500.

4.2.1 Group E inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and table II herein.

4.2.2 JANHC and JANKC devices. Qualification shall be in accordance with MIL-PRF-19500.

4.2.3 JANJ devices. For JANJ level, 3.3.1 through 3.3.1.3 of MIL-PRF-19500 shall apply, except as modified herein. Supplier imposed

requirements as well as alternate screens, procedures, and/or controls shall be documented in the QM plan and must be submitted to the

Qualifying Activity for approval. When alternate screens, procedures, and/or controls are used, in lieu of the JANJ screens herein

equivalency shall be proven and documented in the QM Plan. Radiation characterization may be submitted in the QM plan at the option of

the manufacturer, however, paragraph 3.3.1.1 of MIL-PRF-19500 is not required. Die lot control and rework shall be in accordance with

MIL-PRF-19500 paragraph 3.13 and D 3.13.2.1 for JANS level. Lot formation and conformance inspection requirements for JANJ shall be

those used for JANTXV devices as a minimum.

4.2.4 JANJ Qualification. For JANJ qualification, 4.4.2.1 herein shall be performed as required by the Qualifying Activity.