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MIL-PRF-19500-543 Semiconductor Device, Field Effect Transistors, N-Channel, Silicon Avalanche, Types 2N6764, 2N6764T1, 2N6766, 2N6766T1, 2N6768, 2N6768T1, 2N6770, And 2N6770T1, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for N-channel, enhancement-mode, MOSFET, power transistors. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500 and two levels of product assurance for each unencapsulated die, with avalanche energy ratings \(EAS and EAR\) and maximum avalanche current \(IAR\).

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MIL-PRF-19500/543N
* 4.4.2.1 Group B inspection, table E-VIA (JANS) of MIL-PRF-19500.
Subgroup
Method
Conditions
B3
1051
Test condition G.
*
B4
1042
Test condition D; the heating cycle shall be 1 minute minimum.
Test condition A; VDS = rated VDS (see 1.3), TA = +175° C, t = 120 hours minimum,
B5
1042
read and record VBR(DSS) (pre and post) at ID = 1 mA, read and record IDSS (pre and
post), (see table I).
Test condition B; VGS = rated VGS (see 1.3), TA = +175° C, t = 24 hours minimum.
B5
1042
4.4.2.2 Group B inspection, table E-VIB (JAN, JANTX and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Conditions
B2
1051
Test condition G.
B3
1042
Test condition D, 2,000 cycles. The heating cycle shall be 1 minute minimum.
B5
Not applicable.
B6
Not applicable
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in, table E-VII of MIL-PRF-19500. End-point electrical measurements shall be in accordance with
table I, subgroup 2 herein.
Subgroup
Method
Conditions
C2
2036
Test condition A; for 2N6764, 2N6766, 2N6768, and 2N6770, weight = 10 lbs,
t = 15 seconds; for T1 devices, weight = 9.9 pounds, t = 10 seconds.
See 4.3.4, RθJC max = 0.83° C /W.
C5
3161
C6
1042
Test condition D; 6,000 cycles minimum. The heating cycle shall be 1 minute
minimum.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified in table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of
MIL-STD-750.
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