MIL-PRF-19500/560L
TABLE I. Group A inspection - Continued.
MIL-STD-750
Limit
Symbol
Unit
Inspection 1/
Method
Conditions
Min
Max
Subgroup 2 - Continued.
µA dc
Emitter to base, cutoff
3061
100
IEBO
Bias condition D; VEB = 6.0 V dc
current
Forward - current
3076
60
VCE = 2.0 V dc; IC = 0.5 A dc, pulsed
hFE1
transfer ratio
(see 4.5.1)
Forward - current
3076
60
240
VCE = 2.0 V dc; IC = 2.0 A dc; pulsed
hFE2
transfer ratio
(see 4.5.1)
Forward - current
3076
40
VCE = 2.0 V dc; IC = 5.0 A dc; pulsed
hFE3
transfer ratio
(see 4.5.1)
Collector to emitter
3071
0.7
V dc
IC = 2.0 A dc; IB = 0.2 A dc; pulsed
VCE(SAT)1
voltage (saturated)
(see 4.5.1)
Collector to emitter
3071
1.2
V dc
IC = 5.0 A dc; IB = 0.5 A dc; pulsed
VCE(SAT)2
voltage (saturated)
(see 4.5.1)
Base to emitter voltage
3066
1.2
V dc
Test condition A; IC = 2.0 A dc;
VBE(SAT)1
(saturated)
Base to emitter voltage
3066
1.8
V dc
Test condition A; IC = 5.0 A dc;
VBE(SAT)2
(saturated)
Subgroup 3
TA = +150°C
High - temperature
operation
Collector to emitter
3041
1.0
mA dc
ICEX2
Bias condition A; VCE = 90 V dc;
cutoff current
VBE = 1.5 V dc;
TA = -55°C
Low-temperature
operation
Forward - current
3076
12
VCE = 2.0 V dc; IC = 2.0 A dc; pulsed
hFE4
transfer ratio
(see 4.5.1)
See footnotes at end of table.
13
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