MIL-PRF-19500/560L
TABLE I. Group A inspection - Continued.
MIL-STD-750
Limit
Symbol
Unit
Inspection 1/
Method
Conditions
Min
Max
Subgroup 4
Small - signal short -
3306
3
15
VCE = 10 V dc; IC = 0.5 A dc;
|hfe|
circuit forward -
f = 10 MHz
current transfer ratio
Open circuit output
3236
250
pF
VCB = 10 V dc; IE = 0;
Cobo
100 kHz ≤ f ≤ 1 MHz
capacitance
Input capacitance
3240
1,000
pF
VBE = 2.0 V dc; IC = 0;
Cibo
(output open - circuited)
Pulse response
Pulse delay time
3251
See figure 11
td
100
ns
Pulse rise time
3251
See figure 11
tr
100
ns
�s
Pulse storage time
3251
See figure 12
ts
2
Pulse fall time
3251
See figure 12
tf
200
ns
Subgroup 5
TC = +25�C; t ≥ 0.5 s; 1 cycle
Safe operating area
3051
(continuous dc)
Test 1
VCE = 2.0 V dc; IC = 5.0 A dc
Test 2
VCE = 5.0 V dc; IC = 2.0 A dc
Test 3
VCE = 90 V dc; IC = 55 mA dc
End-point electrical
measurements
Subgroups 6 and 7
Not applicable
1/
For sampling plan see MIL-PRF-19500.
2/
For resubmission of failed subgroup 1, double the sample size of the failed test or sequence of tests. A failure in
table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon
submission.
3/
Separate samples may be used.
4/
Not required for JANS devices.
5/
Not required for laser marked devices.
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