For Parts Inquiries call (727) 344-9615
A Service Disabled Veteran Owned Small Business
© Copyright 2015 Integrated Publishing, Inc.

MIL-PRF-19500-560 Semiconductor Device, Transistor, Npn, Silicon, Switching, Type 2N5339 And 2N5339U3, Jan, Jantx, Jantxv, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhcc, Jankcc, Jankccm, Jankccd, Jankccp, Jankccl, Jankccr, Jankccf, Jankccg, And JankcchThis specification covers the performance requirements for NPN silicon switching transistors. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500 and two levels of product assurance are provided for each unencapsulated device type as specified in MIL-PRF-19500. Provisions for radiation hardness assurance \(RHA\) to eight radiation levels is provided for JANS and JANKC product assurance levels. RHA level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14


img
. . . . . . .
MIL-PRF-19500/560L
TABLE I. Group A inspection - Continued.
MIL-STD-750
Limit
Symbol
Unit
Inspection 1/
Method
Conditions
Min
Max
Subgroup 4
Small - signal short -
3306
3
15
VCE = 10 V dc; IC = 0.5 A dc;
|hfe|
circuit forward -
f = 10 MHz
current transfer ratio
Open circuit output
3236
250
pF
VCB = 10 V dc; IE = 0;
Cobo
100 kHz ≤ f ≤ 1 MHz
capacitance
Input capacitance
3240
1,000
pF
VBE = 2.0 V dc; IC = 0;
Cibo
100 kHz ≤ f ≤ 1 MHz (see 4.5.2)
(output open - circuited)
Pulse response
Pulse delay time
3251
td
100
ns
Pulse rise time
3251
tr
100
ns
µs
Pulse storage time
3251
ts
2
Pulse fall time
3251
tf
200
ns
Subgroup 5
TC = +25°C; t ≥ 0.5 s; 1 cycle
Safe operating area
3051
(continuous dc)
Test 1
VCE = 2.0 V dc; IC = 5.0 A dc
Test 2
VCE = 5.0 V dc; IC = 2.0 A dc
Test 3
VCE = 90 V dc; IC = 55 mA dc
End-point electrical
See table I, subgroup 2
measurements
Subgroups 6 and 7
Not applicable
1/
For sampling plan see MIL-PRF-19500.
2/
For resubmission of failed subgroup 1, double the sample size of the failed test or sequence of tests. A failure in
table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon
submission.
3/
Separate samples may be used.
4/
Not required for JANS devices.
5/
Not required for laser marked devices.
14



For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business

© Copyright 2015 Integrated Publishing, Inc. Site Design & Marketing by Strategico.