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MIL-PRF-19500-601 Semiconductor Device, Field Effect Power Transistors, N-Channel, Silicon, Types 2N7261 And 2N7262 U And U5 Suffixes, Jantxv, And Radiation Hardened Type Suffixes, Jantxvr, F, G, And H And Jansr, F, G, And HThis specification covers the performance requirements for an N-channel, enhancement-mode, MOSFET, radiation hardened and non-hardened, power transistors. Two levels of product assurance are provided for each device type as specified in MIL-PRF-19500, with avalanche energy maximum rating \(EAS\) and maximum avalanche current \(IAS\). See 6.5 for JANHC and JANKC die versions.

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MIL-PRF-19500/601K
4.3.1 Gate stress test. Apply VGS = +30 V minimum for t = 250 µs minimum.
4.3.2 Single pulse avalanche energy (EAS).
Peak current (IAS). .............................................................. IAS(max).
a.
b.
Peak gate voltage (VGS)...................................................... 10 V.
Gate to source resistor (RGS) ............................................. 25Ω ≤ RGS ≤ 200Ω.
c.
Initial case temperature (TC) .............................................. +25°C +10°C, -5°C.
d.
Inductance (L) ................................................................... . L = 2 E  AR  V  BR - V  DD nH minimum
e.
2
( I  DI )    V  BR
f.
Number of pulses to be applied ......................................... 1 pulse minimum.
g.
Supply voltage (VDD) .......................................................... 25 V for 2N7261, 2N7261U, 50 V for
2N7262, 2N7262U.
4.3.3 Thermal impedance. The thermal impedance measurements shall be performed in accordance with method
3161 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tSW, (and VH where appropriate).
Measurement delay time (tMD) = 70 µs max. See table III, group E, subgroup 4 herein.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E-V of MIL-PRF-19500.
End-point electrical measurements shall be in accordance with table I, subgroup 2 herein.
* 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIA (JANS) and table E-VIB (JANTXV) of MIL-PRF-19500 and herein. Electrical
measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
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