MIL-PRF-19500/604B
* TABLE III. Group E inspection (all quality levels) for qualification or re-qualification only.
Inspection
MIL-STD-750
Qualification and
large lot quality
Method
Conditions
conformance
inspection
Subgroup 1
12 devices
c=0
-55°C to +150°C, 500 cycles
Temperature cycling
1051
Hermetic seal
1071
Fine leak
Test conditions G or H
Gross leak
Test conditions C or D
Electrical measurements
Table I, subgroup 2 herein.
Subgroup 2 1/
12 devices
c=0
Steady-state reverse bias
1042
Condition A, 1,000 hours.
Electrical measurements
Table I, subgroup 2 herein.
Steady-state gate bias
1042
Condition B, 1,000 hours.
Electrical measurements
Table I, subgroup 2 herein.
Subgroup 3
3 devices
c=0
DPA
2102
Subgroup 4
Sample size
N/A
Thermal impedance curves
Each supplier shall submit their qual-lot average and
design maximum thermal impedance curves. In addition,
the optimal test conditions and ZθJX limit shall be provided
to the qualifying activity in the qualification report
Subgroup 5
15 devices
c=0
Barometric pressure
1001
2N7278
2N7281
Subgroup 6
3 devices
ESD
1020
Not required for devices classified as ESD class 1.
Subgroup 8
22 devices
c=0
Commutating diode for safe
3476
Test conditions shall be derived by the manufacturer
operating area test procedure
for measuring dv/dt during
reverse recovery of power
MOSFET transistors or
insulated gate bipolar transistors
1/ A separate sample for each test shall be pulled.
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