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MIL-PRF-19500-604 Semiconductor Device, Field Effect Radiation Hardened \(Total Dose Characterization Only\) Transistors, N-Channel, Silicon, Types 2N7272, 2N7275, 2N7278, And 2N7281, Jantxvm, D, And R, And Jansm, D, And RThis specification covers the performance requirements for an N-channel, enhancement-mode, MOSFET, radiation hardened \(total dose characterization only\), power transistor. Two levels of product assurance are provided for each device type specified in MIL-PRF-19500.

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MIL-PRF-19500/604B
* 4.3.1 Gate stress test. Apply VGS = -30 V minimum for t = 250 µs minimum.
* 4.3.2 Single pulse avalanche energy (EAS).
a. IAS = IDM.
b. L = .1 mH.
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c. EAS = 1/2 LIAS .
d. Initial junction temperature = +25°C,+10°C, -5°C.
* 4.3.3 Thermal response (ĆVSD measurement). The delta VSD measurement shall be performed in accordance
with method 3161 of MIL-STD-750. The delta VSD conditions (IH and VH) and maximum limit shall be derived by each
vendor from the thermal response curves (see figure 3). The following parameter measurements shall apply:
Measuring current (IM) ........................................................................10 mA.
a.
Heating time (tH) .................................................................................10 ms.
b.
Measurement time delay (tMD)............................................................30 to 60 µs.
c.
Sample window time (tSW) ..................................................................10 µs maximum.
d.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as
specified herein. Alternate flow is allowed for quality conformance inspection in accordance with MIL-PRF-19500.
* 4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with appendix E of
MIL-PRF-19500 and table I herein. (End-point electrical measurements shall be in accordance with table I, subgroup
2 herein.)
* 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in tables VIa (JANS) and VIb (JANTXV) of MIL-PRF-19500 and herein. Electrical measurements
(end-points) shall be in accordance with the applicable inspections of table I, subgroup 2 herein.
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