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MIL-PRF-19500-604 Semiconductor Device, Field Effect Radiation Hardened \(Total Dose Characterization Only\) Transistors, N-Channel, Silicon, Types 2N7272, 2N7275, 2N7278, And 2N7281, Jantxvm, D, And R, And Jansm, D, And RThis specification covers the performance requirements for an N-channel, enhancement-mode, MOSFET, radiation hardened \(total dose characterization only\), power transistor. Two levels of product assurance are provided for each device type specified in MIL-PRF-19500.

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MIL-PRF-19500/604B
1.4 Primary electrical characteristics at TC = +25°C.
Type
Min
IAS = IDM
VGS(th)1
EAS at
Max rDS(on) (1)
Max IDSS1
RθJC
V(BR)DSS
max
VGS = 0
VDS = VGS
IAS
VGS = 10 V dc
VGS = 0
VDS = 80
ID = 1.0
ID = 1.0
percent
mA dc
TJ =
TJ =
+25°C
+125°C
of rated
mA dc
VDS
at ID2
at ID2
V dc
µA dc
°C/W
V dc
Min  Max
ohm
mJ
ohm
A(pk)
2N7272
100
2.0
4.0
25
0.18
0.36
5.00
24
29
2N7275
200
2.0
4.0
25
0.50
1.10
5.00
15
11
2N7278
250
2.0
4.0
25
0.70
1.68
5.00
12
7
2N7281
500
2.0
4.0
25
2.50
6.50
5.00
6
2
(1) Pulsed (see 4.5.1).
2. APPLICABLE DOCUMENTS
*  2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This
section does not include documents cited in other sections of this specification or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this
specification, whether or not they are listed.
2.2 Government documents.
*  2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-19500
-
Semiconductor Devices, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-750
-
Test Methods for Semiconductor Devices.
*  (Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or
https://www.dodssp.dap.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,
Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this document and the references cited
herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws
and regulations unless a specific exemption has been obtained.
2



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