For Parts Inquiries call (727) 344-9615
A Service Disabled Veteran Owned Small Business
© Copyright 2015 Integrated Publishing, Inc.

MIL-PRF-19500-607 Semiconductor Device, Field Effect Transistors, N-Channel And P-Channel, Silicon, Type 2N7337 Jan, Jantx, Jantxv, Jans, And JanhcThis specification covers the performance requirements for N-channel, and P-channel, enhancement-mode, MOSFET, power transistor. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500, with avalanche energy ratings \(EAS and EAR\) and maximum avalanche current \(IAR\). One level of product assurance is provided for unencapsulated device.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14


MIL-PRF-19500/607B
*
4.3.1 Screening (JANC). Screening shall be in accordance with table IV ofMIL-PRF-19500.
4.3.2 Gate stress test. Apply VGS = 30 V minimum for t = 250 µs minimum.
*
*
4.3.3 Single pulse avalanche energy EAS
a.
Peak current IAS ......................................... ID1.
b.
Peak gate voltage VGS .............................. 10 V.
Gate to source resistor RGS ....................... 25 ≤ RGS ≤ 200Ω.
c.
Initial case temperature .............................. +25°C +10°C, -5°C
d.
Inductance .................................................. 2 E  AS    (VBR - VDD ) mH minimum.
e.
(  I  D1)   
2
VBR
f.
Number of pulses to be applied .................. 1 pulse minimum.
g.
Supply voltage VDD .................................... 25 V (N-channel); -25 V (P-channel).
* 4.3.4 Thermal impedance (ZθJC measurements). The ZθJC measurements shall be performed in accordance
with method 3161 of MIL-STD-750. The maximum limit (not to exceed figure 4, thermal impedance curves) for ZθJC
in screening (table IV of MIL-PRF-19500) and table I shall be derived by each vendor by means of statistical process
control. When the process has exhibited control and capability, the capability data shall be used to establish the
fixed screening limit. In addition to screening, once a fixed limit has been established, monitor all future sealing lots
using a random five piece sample from each lot to be plotted on the applicable X bar R chart. If a lot exhibits an out
of control condition, the entire lot shall be removed from the line and held for engineering evaluation and disposition.
This procedure may be used in lieu of an inline process monitor.
a.
IM measuring current................................... 10 mA.
b.
IH drain heating current ............................... 0.15 A minimum.
c.
tH heating time ........................................... 100 ms.
d.
VH drain-source heating voltage ................. 15 V.
tMD measurement time delay ...................... 30 to 60 µs.
e.
tSW sample window time ............................. 10 µs maximum.
f.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as
specified herein. Alternate flow is allowed for quality conformance inspection in accordance with MIL-PRF-19500.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table
I herein. (End-point electrical measurements shall be in accordance with table I, subgroup 2.)
8



For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business

© Copyright 2015 Integrated Publishing, Inc. Site Design & Marketing by Strategico.