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MIL-PRF-19500-607 Semiconductor Device, Field Effect Transistors, N-Channel And P-Channel, Silicon, Type 2N7337 Jan, Jantx, Jantxv, Jans, And JanhcThis specification covers the performance requirements for N-channel, and P-channel, enhancement-mode, MOSFET, power transistor. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500, with avalanche energy ratings \(EAS and EAR\) and maximum avalanche current \(IAR\). One level of product assurance is provided for unencapsulated device.

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MIL-PRF-19500/607B
*  4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table VIa (JANS) and table VIb (JAN, JANTX and JANTXV) of MIL-PRF-19500.
Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
4.4.2.1 Group B inspection, appendix E, table VIa (JANS) of MIL-PRF-19500.
Subgroup
Method
Conditions
B3
1051
Test condition G, 100 cycles.
*
B4
1042
Test condition D; 2,000 cycles. The heating cycle shall be 1 minute minimum.
Condition A: VDS = rated, TA = +175°C, t = 120 hours. Read and record VBR(DSS)
*
B5
1027
(pre and post) at ID = 1.0 mA (N-CH), ID = -1.0 mA (P-CH). Read and record IDSS
(pre and post), in accordance with table I, subgroup 2. (NOTE: A separate
sample may be pulled for each test)
Condition B: VGS = rated, TA = +175°C, t = 24 hours. (NOTE: A separate
B5
1042
sample may be pulled for each test)
B6
3161
See 4.5.2.
4.4.2.2 Group B inspection, appendix E, table VIb (JAN, JANTX and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Conditions
B2
1051
Test condition G, 25 cycles.
Test condition A: VDS = 80 percent of rated. TA = +150°C, t = 160 hours. (NOTE:
B3
1027
A separate sample may be pulled for each test)
Test condition B: VGS = 80 percent of rated. TA = +150°C, t = 24 hours. (NOTE:
B3
1042
A separate sample may be pulled for each test)
B5 and B6
Not applicable.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table VII of MIL-PRF-19500. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein.
Subgroup
Method
Conditions
C2
1056
Test condition E; The sampling plan applies to the number of leads tested. A
minimum of three devices shall be tested.
*
C5
3161
See 4.5.2.
Test condition A: VDS = 80 percent of rated. TA = +150°C, t = 340 hours.
C6
1026
*  4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table IX of MIL-PRF-19500 and as specified in table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup2 herein.
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