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MIL-PRF-19500-624 Semiconductor Device, Transistor, Npn, Silicon, Power Darlington Type 2N7370, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for NPN silicon, high power Darlington transistors. Four levels of product assurance are provided for each device type as specified in MIL–PRF–19500.

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MIL­PRF­19500/624E
TABLE II. Group E inspection (all quality levels) - for qualification and re-qualification only.
Qualification
Inspection
sample plan
Method
Conditions
Subgroup 1
45 devices; c = 0
Temperature cycling
1051
500 cycles.
(air to air)
Hermetic seal
1071
Fine leak
Gross leak
Electrical measurements
See table I, subgroup 2 herein.
Subgroup 2
45 devices; c = 0
High temperature
1039
Condition A; 1,000 hours.
reverse bias
Electrical measurements
See table I, subgroup 2 herein.
Subgroup 4
Sample size N/A
Thermal impedance curves
Subgroup 5
Not applicable
Subgroup 8
45 devices; c = 0
Reverse voltage leakage
1033
Condition B.
stability
10



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