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MIL-PRF-19500-624 Semiconductor Device, Transistor, Npn, Silicon, Power Darlington Type 2N7370, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for NPN silicon, high power Darlington transistors. Four levels of product assurance are provided for each device type as specified in MIL–PRF–19500.

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MIL­PRF­19500/624E
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table E­VIA (JANS) or table E­VIB (JAN, JANTX, and JANTXV) of
MIL­PRF­19500 and herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2
herein. Delta requirements shall be in accordance with the applicable step of 4.6 herein.
4.4.2.1 Quality level JANS (table E­VIA of MIL­PRF­19500).
Subgroup
Method
Conditions
VCB ≥ 10 V dc, 2,000 cycles, adjust device current, or power, to achieve a minimum
B4
1037
ĆTJ of +100°C.
B5
2037
Test condition A.
4.4.2.2 Quality levels JAN, JANTX, and JANTXV (table E­VIB of MIL­PRF­19500).
Subgroup
Method
Conditions
VCB ≥ 10 V dc, 2,000 cycles, adjust device current, or power, to achieve a minimum
B3
1037
ĆTJ of +100°C.
TA = +200°C.
B6
1032
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E­VII of MIL­PRF­19500 and as follows herein. Electrical measurements (end-points) shall
be in accordance with table I, subgroup 2 herein. Delta requirements shall be in accordance with the applicable step
of 4.6 herein.
Subgroup
Method
Conditions
C2
1056
Test condition B.
C2
2036
Test condition A (tension), weight = 10 pounds (4.5 kg), t = 10 seconds.
C5
3131
See 4.3.1.
VCB ≥ 10 V dc, 6,000 cycles, adjust device current, or power, to achieve a minimum
C6
1037
ĆTJ of +100°C.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E­IX of MIL­PRF­19500 and as specified in table II herein. Electrical
measurements (end-points) shall be in accordance with table I, subgroup 2 herein. Delta requirements shall be in
accordance with the applicable step of 4.6 herein.
4.5 Method of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse response measurements. The conditions for pulse response measurement shall be as specified in
section 4 of MIL­STD­750.
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