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MIL-PRF-19500-624 Semiconductor Device, Transistor, Npn, Silicon, Power Darlington Type 2N7370, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for NPN silicon, high power Darlington transistors. Four levels of product assurance are provided for each device type as specified in MIL–PRF–19500.

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MIL­PRF­19500/624E
4.6 Delta requirements (JANS). The requirements for delta measurements for groups B, C, and E shall be as
specified below. (1) (2) (3)
Limit
Step
Inspection
Symbol
Unit
Method
Conditions
Min
Max
ĆhFE1
VCE = 3.0 V dc;
1.
Forward-current
3076
±40 percent
transfer ratio
change from initial
IC = 6.0 A dc;
(4)
value.
pulsed (see 4.5.1)
(1) The delta electrical measurements for group B, product assurance level JANS, shall be as follows:
a.  In addition to the measurements specified for subgroup 4 of table E­VIA of MIL­PRF­19500, the
measurements of step 1 shall also be taken.
b.  In addition to the measurements specified for subgroup 5 of table E­VIA of MIL­PRF­19500, the
measurements of step 1 shall also be taken.
(2) The delta electrical measurements for group C, product assurance level JANS, shall be as follows:
a.  In addition to the measurements specified for subgroup 2 of table E­VII of MIL­PRF­19500, the
measurements of step 1 shall also be taken.
b.  In addition to the measurements specified for subgroup 3 of table E­VII of MIL­PRF­19500, the
measurements of step 1 shall also be taken.
c.  In addition to the measurements specified for subgroup 6 of table E­VII of MIL­PRF­19500, the
measurements of step 1 shall also be taken.
(3) The delta measurements for group E, product assurance level JANS, shall be as follows: In addition to the
measurements specified for subgroups 1 and 2 of table E­IX of MIL­PRF­19500, the measurements of step 1
shall also be taken.
(4) Devices which exceed the group A limits for this test shall not be supplied as complaint parts but are not
considered failures for the test.
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