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MIL-PRF-19500-624 Semiconductor Device, Transistor, Npn, Silicon, Power Darlington Type 2N7370, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for NPN silicon, high power Darlington transistors. Four levels of product assurance are provided for each device type as specified in MIL┬ûPRF┬û19500.

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MIL�PRF�19500/624E

4.6 Delta requirements (JANS). The requirements for delta measurements for groups B, C, and E shall be as

specified below. (1) (2) (3)

MIL�STD�750

Limit

Step

Inspection

Symbol

Unit

Method

Conditions

Min

Max

ĆhFE1

VCE = 3.0 V dc;

1.

Forward-current

3076

�40 percent

transfer ratio

change from initial

IC = 6.0 A dc;

(4)

value.

pulsed (see 4.5.1)

(1) The delta electrical measurements for group B, product assurance level JANS, shall be as follows:

a. In addition to the measurements specified for subgroup 4 of table E�VIA of MIL�PRF�19500, the

measurements of step 1 shall also be taken.

b. In addition to the measurements specified for subgroup 5 of table E�VIA of MIL�PRF�19500, the

measurements of step 1 shall also be taken.

(2) The delta electrical measurements for group C, product assurance level JANS, shall be as follows:

a. In addition to the measurements specified for subgroup 2 of table E�VII of MIL�PRF�19500, the

measurements of step 1 shall also be taken.

b. In addition to the measurements specified for subgroup 3 of table E�VII of MIL�PRF�19500, the

measurements of step 1 shall also be taken.

c. In addition to the measurements specified for subgroup 6 of table E�VII of MIL�PRF�19500, the

measurements of step 1 shall also be taken.

(3) The delta measurements for group E, product assurance level JANS, shall be as follows: In addition to the

measurements specified for subgroups 1 and 2 of table E�IX of MIL�PRF�19500, the measurements of step 1

shall also be taken.

(4) Devices which exceed the group A limits for this test shall not be supplied as complaint parts but are not

considered failures for the test.

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