MIL-STD-750F
FOREWORD
1. This test method standard is approved for use by all Departments and Agencies of the Department of Defense.
2. This issue of MIL-STD-750 series establishes uniform test methods for testing the environmental, physical, and electrical characteristics semiconductor devices.
3. This entire test method standard has been revised. This revision has been issued in six parts; the basic test method standard (this document) and five numbered parts. This was done in order to provide flexibility in the use and the updating of the test methods. The six parts are listed as follows:
MIL-STD-750 - Test Methods For Semiconductor Devices.
MIL-STD-750-1 - Environmental Test Methods For Semiconductor Devices. MIL-STD-750-2 - Mechanical Test Methods For Semiconductor Devices.
MIL-STD-750-3 - Electrical Characteristics Tests for Bipolar, MOSFET, and Gallium Arsenide Transistors.
MIL-STD-750-4 - Electrical Characteristics Tests for Diodes, Microwave Diodes, Thyristors, and Tunnel
Diodes.
MIL-STD-750-5 - High Reliability Space Application Test Methods For Semiconductor Devices.
4. Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Logistics Agency, DLA Land and Maritime, ATTN: VAC, P.O. Box 3990, Columbus, OH
43218-3990, or emailed to semiconductor@dla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at https://assist.daps.dla.mil.
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