MIL-STD-750F
e. Standard reference material (or controlled correlation device) testing providing observable data.
NOTE: Observable data from a controlled device may be relied upon to provide feedback that confirms process performance is within statistical limits.
f. Analysis of systematic and random errors, applying corrections as applicable.
g. Any other recognized method of combining errors into an expression of uncertainty substantiated by an engineering analysis.
4.1.3.2 Test methods and circuits. Unless otherwise stated in the specific test method, the methods and circuits shown are given as the basic measurement method. The methods and circuits shown are not necessarily the only method or circuit which can be used, but the manufacturer shall demonstrate to the acquiring activity that alternate methods or circuits which they may desire to use are equivalent and give results within the desired accuracy of measurement (see 4.1.3).
4.1.4 Calibration requirements. Calibration and certification procedures shall be provided in accordance with NCSL Z540.3 for plant standards and instruments used to measure or control production processes and semiconductor devices under test. For those measurements that are not traceable to the National Institute of Standards and Technology (NIST), correlation samples shall be maintained and used as the basis of proving acceptability when such proof is required. In addition, the following requirements shall apply:
a. The accuracy of a calibrating instrument shall be at least four times greater than that of the item being calibrated, unless the item being calibrated is state of the art equipment, which may be near or equal in accuracy to the state of the art calibrating equipment, in which case the four times requirement does not apply. However, the instrument shall be calibrated to correlate with standards established by the NIST.
b. Except in those cases where the NIST recommends a longer period, and concurrence is obtained from the qualifying activity, calibration intervals for plant electrical standards shall not exceed one year and plant mechanical standards shall not exceed two years.
4.2 Orientations.
a. X is the orientation of a device with the main axis of the device normal to the direction of the accelerating force, and the major cross section parallel to the direction of the accelerating force.
b. Y is the orientation of a device with the main axis of the device parallel to the direction of the accelerating force, and the principal base toward (Y1), or away from (Y2), the point of application of the accelerating force.
c. Z is the orientation of a device with the main axis and the major cross section of the device normal to the direction of the accelerating force. Z is 90 degrees of X.
NOTE: For case configurations, other than those shown on figures 1 and 2, the orientation of the device shall be as specified in the individual specification sheet.
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