MIL-STD-750F
6.3 Subject term (key word) listing.
Accuracy
Bias requirements
Destructive tests
Electrical characteristics tests for microwave diodes
Electrical characteristics tests for MOS field effect transistors
High frequency tests
Laboratory suitability Low frequency tests Non-destructive tests
6.4 Changes from previous issue. The margins of this standard are marked with vertical lines to indicate where changes from the previous issue were made. This was done as a convenience only and the Government assumes no liability whatsoever for any inaccuracies in these notations. Bidders and contractors are cautioned to evaluate the requirements of this document based on the entire content irrespective of the marginal notations and relationship to the last previous issue.
Custodians: Preparing activity: Army - CR DLA - CC Navy - EC
Air Force - 85 Project: 5961-2012-034
NASA - NA DLA - CC
Review activities: Army - AR, MI, SM
Navy - AS, CG, MC, SH Air Force - 19, 99
Other - NRO
NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at https://assist.daps.dla.mil.
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