MIL-STD-750F
CONTENTS
PARAGRAPH PAGE FOREWORD..………………………………………………………………………………………….…...…..ii
1. SCOPE .......................................................................................................................................1
1.1 Purpose.................................................................................................................................1
1.2 Numbering system ................................................................................................................1
1.2.1 Classification of tests.......................................................................................................1
1.2.2 Test method revisions .....................................................................................................1
1.3 Methods of reference ............................................................................................................1
2. APPLICABLE DOCUMENTS......................................................................................................2
2.1 General .................................................................................................................................2
2.2 Government documents........................................................................................................2
2.2.1 Specifications, standards, and handbooks ......................................................................2
2.3 Non-Government publications...............................................................................................2
2.4 Order of precedence .............................................................................................................3
3. DEFINITIONS .............................................................................................................................3
3.1 Acronyms, symbols, and definitions ......................................................................................3
3.1.1 Acronyms used in this standard.......................................................................................3
4. GENERAL REQUIREMENTS.....................................................................................................4
4.1 Test conditions ......................................................................................................................4
4.1.1 Permissible temperature variation in environmental chambers .......................................4
4.1.2 Electrical test frequency ..................................................................................................5
4.1.3 Accuracy..........................................................................................................................5
4.1.3.1 Control based on uncertainty.....................................................................................5
4.1.3.2 Test methods and circuits..........................................................................................6
4.1.4 Calibration requirements .................................................................................................6
4.2 Orientations...........................................................................................................................6
4.3 General precautions..............................................................................................................8
4.3.1 Transients........................................................................................................................8
4.3.2 Test conditions for electrical measurements ...................................................................8
4.3.2.1 Thermal resistance measurements (test method series 3100) ..................................8
4.3.2.2 Low frequency tests (test method series 3200) .........................................................8
4.3.2.3 High frequency tests (test method series 3300).........................................................8
4.3.2.4 Electrical characteristics tests for MOS field effect transistors (3400 series).............8
4.3.2.5 Steady-state dc measurements (test method series 4000)........................................8
4.3.2.6 Pulse measurements (test method series 4000)........................................................8
4.3.2.7 Electrical characteristics tests for microwave diodes (test method series 4100)........9
4.3.3 Test circuits .....................................................................................................................9
4.3.3.1 Test method variation ................................................................................................9
4.3.4 Soldering .........................................................................................................................9
4.3.5 Order of connection of leads ...........................................................................................9
4.3.6 Radiation precautions......................................................................................................9
4.3.7 Handling precautions.......................................................................................................10
4.3.7.1 UHF and microwave devices .....................................................................................10
4.3.7.2 Electrostatic discharge sensitive devices...................................................................10
4.4 Continuity verification of burn-in and life tests .......................................................................10
4.4.1 Bias interruption ....................................................................................................................10
4.5 Requirements for high temperature reverse bias (HTRB) and burn-in ..................................11
4.6 Bias requirements .................................................................................................................11
4.7 Destructive tests....................................................................................................................12
4.8 Non-destructive tests............................................................................................................13
4.9 Laboratory suitability .............................................................................................................14
4.10 Recycled, recovered, or environmentally preferable materials..............................................14
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