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MIL-PRF-19500-323 Semiconductor Device, Transistor, Pnp, Silicon, Switching, Types 2N3250A, 2N3251A, 2N3250Aub, 2N3251Aub, Jan, Jantx, Jantxv, Jantxvm, Jantxvd, Jantxvp, Jantxvl, Jantxvr, Jantxvf, Jantxvg, Jantxvh, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhc, Janhcm, Janhcd, Janhcp, Janhcl, Janhcr, Janhcf, Janhcg, Janhch, Jankc, Jankcm, Jankcd, Jankcp, Jankcl, Jan...This specification covers the performance requirements for PNP silicon switching transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for die. RHA level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices which have passed RHA requirements.

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MIL-PRF-19500/323N
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limit
Unit
Method
Conditions
Min
Max
Subgroup 4 ­ Continued
Pulse response:
On-time
3251
70
ns
Test condition A; IC = 10 mA dc;
ton
IB1 = 1.0 mA dc; (see figure 11)
Off time
3251
Test condition A; IC = 10 mA dc;
toff
IB1 = IB2 = 1.0 mA dc (see figure 12)
2N3250A,
250
ns
2N3250AUB
2N3251A,
300
ns
2N3251AUB
Small-signal open circuit
3211
hre
VCE = 10 V dc;
reverse-voltage transfer
IC = 1.0 mA dc; f = 1 kHz
ratio
x 10 -4
2N3250A,
10
2N3250AUB
x 10 -4
2N3251A,
20
2N3251AUB
Small-signal short circuit
3201
VCE = 10 V dc; IC = 1.0 mA dc;
hie
input impedance
f = 1 kHz
kΩ
2N3250A,
1
6
2N3250AUB
kΩ
2N3251A,
2
12
2N3251AUB
Small-signal open circuit
3216
VCE = 10 V dc; IC = 1.0 mA dc;
hoe
output admittance
f = 1 kHz
µmhos
2N3250A,
4
40
2N3250AUB
µmhos
2N3251A,
0
60
*
2N3251AUB
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed test in subgroup 1 of table I, double the sample size of the failed test or sequence
of tests. A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test
shall be rerun upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
6/ This hermetic seal test is an end-point to temp-cycling in addition to electrical measurements.
7/ This test required for the following end-point measurements only:
Group B, step 1 of 4.4.2.2 herein (JAN, JANTX, and JANTXV).
Group B, subgroups 3, 4, and 5 (JANS).
Group C, subgroup 2 and 6.
Group E, subgroup 1 and 2.
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