MIL-PRF-19500/350L
* TABLE I. Group A inspection.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 1 2/
2071
n = 45 devices, c = 0
Visual and mechanical
examination 3/
Solderability 3/ 4/
2026
n = 15 leads, c = 0
1022
n = 15 devices, c = 0
Resistance to solvent 3/ 4/ 5/
Temperature cycling 3/ 4/
1051
Test condition C, 25 cycles.
n = 22 devices, c = 0
Hermetic seal 5/
1071
n = 22 devices, c = 0
Fine leak
Gross leak
Electrical measurements 4/
Table I, subgroup 2
Precondition TA = +250°C at
Bond strength 3/ 4/
2037
t = 24 hrs or TA = +300°C at
t = 2 hrs, n = 11 wires, c = 0.
Decap internal visual
2075
n = 4 devices, c = 0.
(design verification) 4/
Subgroup 2
°C/W
Thermal impedance
3131
See 4.3.3
ZθJX
Collector to base
3036
ICBO1
cutoff current
µA dc
2N3867, 2N3867S, 2N3867U4
100
VCB = 40 V dc
µA dc
2N3868, 2N3868S, 2N3868U4
100
VCB = 60 V dc
µA dc
Emitter to base cutoff
3061
Bias condition D;
100
IEBO1
current
VEB = 4 V dc
Breakdown voltage,
3011
Bias condition D; IC = 20 mA dc;
V(BR)CEO
collector to emitter
pulsed (see 4.5.1)
2N3867, 2N3867S, 2N3867U4
40
V dc
2N3868, 2N3868S, 2N3868U4
60
V dc
See footnotes at end of table.
11
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business