MIL-PRF-19500/350L
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 2 - continued.
3066
Base emitter
2.0
V dc
Test condition A; IC = 2.5 A dc;
VBE(sat)3
voltage (saturated)
IB = 250 mA dc; pulsed (see 4.5.1)
Subgroup 3
TA = +150°C
High temperature
operation:
µA dc
50
ICEX2
Collector to emitter
3041
Bias condition A, VEB = 2.0 V dc
cutoff current
2N3867, 2N3867S, 2N3867U4
VCE = 40 V dc
2N3868, 2N3868S, 2N3868U4
VCE = 60 V dc
Low temperature
TA = -55°C
operation:
Forward-current
3076
VCE = 1.0 V dc, IC = 500 mA dc,
hFE5
transfer ratio
pulsed (see 4.5.1)
2N3867, 2N3867S, 2N3867U4
25
2N3868, 2N3868S, 2N3868U4
17
Subgroup 4
Magnitude of common-
3306
3
12
VCE = 5 V dc, IC = 100 mA dc,
|hfe|
emitter small-signal
f = 20 MHz
short-circuit forward-
current transfer ratio
Open circuit output
3236
120
pF
VCB = 10 V dc, IE = 0,
Cobo
capacitance
100 kHz ≤ f ≤ 1 MHz
3240
Input capacitance
800
pF
VEB = 3.0 V dc, IC = 0,
Cibo
(output open-circuited)
100 kHz ≤ f ≤ 1 MHz
Subgroup 5
Pulse response
3251
Test condition A
Delay time
35
ns
VCC = -30 V dc, VEB = 0 ,
td
IC = 1.5 A dc, IB1 = 150 mA dc,
See figure 12
See footnotes at end of table.
13
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