MIL-PRF-19500/350L
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 2 Continued
µA dc
1.0
Collector to emitter
3041
Bias condition A;
ICEX1
cutoff current
VEB = 2.0 V dc
VCE = 40 V dc,
2N3867, 2N3867S, 2N3867U4
VCE = 60 V dc
2N3868, 2N3868S, 2N3868U4
Forward-current
3076
VCE = 1.0 V dc, IC = 500 mA dc,
hFE1
transfer ratio
pulsed (see 4.5.1)
2N3867, 2N3867S, 2N3867U4
50
2N3868, 2N3868S, 2N3868U4
35
Forward-current
3076
VCE = 2.0 V dc, IC = 1.5 A dc,
hFE2
transfer ratio
pulsed (see 4.5.1)
2N3867, 2N3867S, 2N3867U4
40
200
2N3868, 2N3868S, 2N3868U4
30
150
Forward-current
3076
VCE = 3.0 V dc, IC = 2.5 A dc,
hFE3
transfer ratio
pulsed (see 4.5.1)
2N3867, 2N3867S, 2N3867U4
25
2N3868, 2N3868S, 2N3868U4
20
3076
Forward-current
20
VCE = 5.0 V dc, IC = 3.0 A dc,
hFE4
transfer ratio
pulsed (see 4.5.1)
Collector to emitter
3071
VCE(sat)1
0.5
V dc
IC = 500 mA dc; IB = 50 mA dc,
voltage (saturated)
pulsed (see 4.5.1)
Collector to emitter
3071
0.75
V dc
IC = 1.5 A dc; IB = 150 mA dc;
VCE(sat)2
voltage (saturated)
pulsed (see 4.5.1)
Collector to emitter
3071
IC = 2.5 A dc; IB = 250 mA dc;
1.5
V dc
VCE(sat)3
voltage (saturated)
pulsed (see 4.5.1)
Base emitter
3066
Test condition A; IC = 500 mA dc;
1.0
V dc
VBE(sat)1
voltage (saturated)
IB = 50 mA dc; pulsed (see 4.5.1)
3066
Test condition A; IC = 1.5 A dc;
Base emitter
VBE(sat)2
voltage (saturated)
IB = 150 mA dc; pulsed (see 4.5.1)
2N3867, 2N3867S, 2N3868,
0.9
1.4
V dc
2N3868S
2N3867U4, 2N3868U4
0.85
1.4
V dc
See footnotes at end of table.
12
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