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MIL-PRF-19500-350 Semiconductor Device, Transistor, Pnp, Silicon, Low Power Types 2N3867, 2N3867S, 2N3867U4, 2N3868, 2N3868S, And 2N3868U4, Jan, Jantx, Jantxv, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhcb, Jankcb, Jankcbm, Jankcbd, Jankcbp, Jankcbl, Jankcbr, Jankcbf, Jankcbg, And JankcbhThis specification covers the performance requirements for PNP, silicon, switching transistor. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type. Provisions for radiation hardness assurance \(RHA\) to eight radiation levels is provided for JANTXV, JANS, JANHC, and JANKC product assurance levels. RHA level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

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MIL-PRF-19500/350L
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 5 - Continued
Pulse response
3251
Test condition A
Rise time
65
ns
VCC = -30 V dc, VEB = 0 V dc,
tr
IC = 1.5 A dc, IB1 = 150 mA dc,
See figure 12
Storage time
500
ns
VCC = -30 V dc, VEB = 0 V dc,
ts
IC = 1.5 A dc,
IB1 = IB2 = 150 mA dc,
See figure 13
Fall time
100
ns
tf
VCC = -30 V dc, VEB = 0 V dc,
IC = 1.5 A dc,
IB1 = IB2 = 150 mA dc,
See figure 13
TC = +25°C, 1 cycle,
SOA (continuous dc)
3051
t = 1.0 s, (see figure 14)
Test 1
VCE = 3.33 V dc, IC = 3 A dc
Test 2
2N3867, 2N3867S, 2N3867U4
VCE = 40 V dc, IC = 160 mA dc
2N3868, 2N3868S, 2N3868U4
VCE = 60 V dc, IC = 80 mA dc
Electrical measurements
See table IV, steps 1 and 2.
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed subgroup 1, double the sample size of the failed test or sequence of tests. A failure in
table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon
submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
14



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