MIL-PRF-19500-398 Semiconductor Device, Transistor, Npn, Silicon, High-Frequency, Types 2N3866, 2N3866A, 2N3866Ub, 2N3866Aub, Jan, Jantx, Jantxv, Jans, Janhc, Jankc, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhcm, Janhcd, Janhcp, Janhcl, Janhcr, Janhcf, Janhcg, Janhch, Jankcm, Jankcd, Jankcp, Jankcl, Jankcr, Jankcf, Jankcg, And JankchThis specification covers the performance requirements for NPN silicon, VHF-UHF amplifier transistor. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for die. Radiation hardness assurance \(RHA\) level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices which have passed RHA requirements.

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MIL-PRF-19500/398K

* TABLE III. Group E inspection (all quality levels) � for qualification or re-qualification only.

Inspection

MIL-STD-750

Qualification

Method

Conditions

45 devices

Subgroup 1

c=0

Test condition C, 500 cycles.

1051

Temperature cycling

(air to air)

1071

Hermetic seal

Fine leak

Gross leak

Electrical measurements

See table I, subgroup 2 herein.

Subgroup 2

45 devices

c=0

Intermittent life

1037

VCB = 10 V dc, 6,000 cycles, adjust power or current to

achieve a ĆTJ = +100�C.

Electrical measurements

See table I, subgroup 2 herein.

Subgroup 4

Sample size

N/A

Thermal response curves

Subgroup 5

Not applicable

Subgroup 6

11 devices

c=0

1020

ESD

Subgroup 8

45 devices

c=0

Reverse stability

1033

Condition B