MIL-PRF-19500-398 Semiconductor Device, Transistor, Npn, Silicon, High-Frequency, Types 2N3866, 2N3866A, 2N3866Ub, 2N3866Aub, Jan, Jantx, Jantxv, Jans, Janhc, Jankc, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhcm, Janhcd, Janhcp, Janhcl, Janhcr, Janhcf, Janhcg, Janhch, Jankcm, Jankcd, Jankcp, Jankcl, Jankcr, Jankcf, Jankcg, And JankchThis specification covers the performance requirements for NPN silicon, VHF-UHF amplifier transistor. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for die. Radiation hardness assurance \(RHA\) level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices which have passed RHA requirements.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15

MIL-PRF-19500/398K

TABLE I. Group A inspection - Continued.

Inspection 1/

MIL-STD-750

Symbol

Limits

Unit

Method

Conditions

Min

Max

η1

Collector-efficiency

VCC = 28 V dc; Pin = 0.15 W;

f = 400 MHz (see 4.5.3)

η2

VCC = 28 V dc; Pin = 0.075 W;

Collector-efficiency

f = 400 MHz (see 4.5.3)

Subgroups 5 and 6

Not applicable

Subgroup 7

3011

V dc

Collector-emitter

VBE = -1.5 V dc; IC = 40 mA dc

V(BR)CEX

breakdown voltage

(clamped inductive)

For sampling plan see MIL-PRF-19500.

For resubmission of failed subgroup A1, double the sample size of the failed test or sequence of tests. A

failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun

upon submission.

Separate samples may be used.

Not required for JANS devices.

Not required for laser marked devices.

This test required for the following end-point measurements only:

Group B, subgroups 3, 4, and 5 (JANS).

Group B, steps 2 and 3 (JAN, JANTX, and JANTXV).

Group C, subgroups 2 and 6.

Group E, subgroups 1 and 2.