MIL-PRF-19500/398K
4.4.2.2 Group B inspection, table E-VIb (JAN, JANTX, and JANTXV). Separate samples may be used for each
step. In the event of a group B failure, the manufacturer may pull a new sample at double size from either the failed
assembly lot or from another assembly lot from the same wafer lot. If the new "assembly lot" option is exercised, the
failed assembly lot shall be scrapped.
Step
Method
Conditions
1
1026
Steady-state life: 1,000 hours, VCB = 10 to 30 V dc; power shall be applied to achieve
TJ = +150°C minimum and a power dissipation of PD ≥ 75 percent of max rated PT as defined
in 1.3. n = 45 devices, c = 0. The sample size may be increased and the test time decreased
as long as the devices are stressed for a total of 45,000 device hours minimum, and the
actual time of test is at least 340 hours.
2
1048
Blocking life, TA = +150°C, VCB = 80 percent of rated voltage, 48 hours minimum.
n = 45 devices, c = 0.
High-temperature life (non-operating), t = 340 hours; TA = +200°C. n = 22, c = 0.
3
1032
4.4.2.3 Group B sample selection. Samples selected from group B inspection shall meet all of the following
requirements.
a.
For JAN, JANTX, and JANTXV samples shall be selected randomly from a minimum of three wafers (or from
each wafer in the lot) from each wafer lot. For JANS samples shall be selected from each inspection lot.
See MIL-PRF-19500.
Shall be chosen from an inspection lot that has been submitted to and passed table I, subgroup 2
b.
conformance inspection. When the final lead finish is solder or any plating prone to oxidation at high
temperature, the samples for life test (subgroups B4 and B5 for JANS, and group B for JAN, JANTX, and
JANTXV) may be pulled prior to the application of final lead finish.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table E-VII of MIL-PRF-19500, and in 4.4.3.1 (JANS) and 4.4.3.2 (JAN, JANTX, and
JANTXV) herein for group C testing. Electrical measurements (end-points) requirements shall be in accordance with
table I, subgroup 2 herein.
4.4.3.1 Group C inspection, table E-VII (JANS) of MIL-PRF-19500.
Subgroup
Method
Conditions
C2
2036
Test condition E (not applicable to UB suffix devices).
C5
3131
See 4.5.2; n = 22, c =0.
1,000 hours, VCB = 10 V dc; power shall be applied to achieve TJ = +150°C
C6
1026
minimum and a power dissipation of PD ≥ 75 percent of max rated PT as defined
in 1.3. n = 45 devices, c = 0. The sample size may be increased and the test
time decreased as long as the devices are stressed for a total of 45,000 device
hours minimum, and the actual time of test is at least 340 hours.
9
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