MIL-PRF-19500-553 Semiconductor Device, Diode, Silicon, Schottky Barrier, Fast Recovery, Type 1N6391, Jan, Jantx, Jantxv, Jans, And JanhcThis specification covers the performance requirements for a silicon, fast recovery, schottky barrier diode, intended for use as a power rectifier in rectifier recovery circuits, or as a flyback diode in power switching applications. Four levels of product assurance are provided for each encapsulated device type as specified in MIL┬ûPRF┬û19500. One level of product assurance is provided for each unencapsulated device type \(die\) as specified in MIL┬ûPRF┬û19500.

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MIL�PRF�19500/553F

4.5.4 Thermal resistance. Thermal resistance measurement shall be performed in accordance with test method

4081 of MIL�STD�750. Read and record data in accordance with table II herein shall be included in the qualification

report.

IH > rated IO.

tH = 20 seconds minimum.

IM = 50 mA to 250 mA.

tMD = 300 �s maximum.

4.5.5 Reverse current at peak reverse voltage, alternate test. The reverse current at peak reverse voltage test

requirement may be satisfied by performing the reverse energy test of 4.5.2 and measuring breakdown voltage to

ensure VBR ≥ 54 V (pk) with IRM = 2.0 A (pk).

4.5.6 DC intermittent operation life. DC intermittent operation life shall be performed in accordance with test

method 1037 of MIL�STD�750. A cycle shall consist of an "on" period, when forward current is applied suddenly, not

gradually, to the device for the time necessary to achieve an increase (delta) case temperature of +85�C +15�C, �5�C

followed by an "off" period, when the current is suddenly removed for cooling, the case through a similar delta

temperature. Auxiliary (forced) cooling is permitted during the "off" period only. Forward current or "on" time, within

specific limits, and "off" time may be adjusted to achieve the delta case temperature. Heat sinks shall only be used if,

and to the degree necessary, to maintain test samples within the desired delta temperature tolerance. The heating

time shall be such that 30 s ≤ theating ≤ 180 s. The forward current may be steady-state dc, full-wave rectified dc, or

the equivalent half-sine wave dc, of the specified value. The test duration shall be the specified number of cycles.

Within the time interval of 50 cycles before and 500 cycles after the termination of the test, the sample units shall be

removed from the specified test conditions and allowed to reach room ambient conditions. Specified end-point

measurements for qualification and quality conformance inspections shall be completed within 96 hours after removal

of sample units from the specified test conditions. Additional readings may be taken at the discretion of the

manufacturer.

4.5.7 Inspection conditions. Unless otherwise specified in MIL�PRF�19500 or herein, all inspections shall be

conducted at a TC of 25�C �3�C.