MIL-PRF-19500/557L
Subgroup Method
Condition
B3
1051
Test condition G.
*
B4
1042
Test condition D. The heating cycle shall be 1 minute minimum.
Accelerated steady-state operation life; test condition A; VDS = rated TA = +175�C,
B5
1042
t = 120 hours. Read and record V(BR)DSS (pre and post) at 1 mA = ID. Read and
record IDSS (pre and post). Deltas for V(BR)DSS shall not exceed 10 percent and
IDSS shall not exceed 25 �A. Accelerated steady-state gate stress; condition B,
VGS = rated, TA = +175�C, t = 24 hours.
B5
2037
Bond strength (Al-Au die interconnects only); test condition D.
Subgroup Method
Condition
B2
1051
Test condition G.
*
B3
1042
Test condition D. The heating cycle shall be 1 minute minimum.
B3
2037
Test condition D. All internal bond wires for each device shall be pulled separately.
* 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500 and as follows. Electrical measurements (end-points) shall be in
Subgroup
Method
Condition
C2
2036
Test condition E (not required for LCC).
C5
3161
*
C6
1042
Test condition D. The heating cycle shall be 1 minute minimum.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified in table II herein. Electrical measurements (end-
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
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