MIL-PRF-19500-586 Semiconductor Device, Diode, Silicon, Schottky Barrier, Types 1N5817-1, 1N5817Ur-1, 1N5819-1, 1N5819Ur-1, 1N6761-1, And 1N6761Ur-1, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for silicon, Schottky barrier diodes. Four levels of product assurance are provided for each encapsulated device types as specified in MIL-PRF-19500. Two levels of product assurance are provided for unencapsulated devices \(die\) as specified in MIL-PRF-19500.

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MIL�PRF�19500/586L

3.5 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance

characteristics are as specified in 1.3, 1.4, and table I.

3.6 Electrical test requirements. The electrical test requirements shall be as specified in table I herein.

3.7 Marking.

3.7.1 Axial lead devices. Marking shall be in accordance with MIL�PRF�19500. Manufacturer's identification and

date code shall be marked on the devices. Initial container package marking shall be in accordance with

MIL�PRF�19500. The polarity shall be indicated with a contrasting color band to denote the cathode end. The

prefixes JAN, JANTX, JANTXV, and JANS may be abbreviated as J, JX, JV, and JS respectively. Manufacturer's

identification and date code shall be marked on the devices. The part number may be reduced to J5817, JX5817,

JV5817, or JS5817. Color coding shall not be permitted for part numbering.

3.7.2 MELF surface mount devices (UR versions). For UR suffix devices only, all marking, except polarity may be

omitted from the body, but shall be retained on the initial container.

3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and

shall be free from other defects that will affect life, serviceability, or appearance.

4. VERIFICATION

4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:

Qualification inspection (see 4.2).

Screening (see 4.3).

Conformance inspection (see 4.4 and tables I and II).

4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL�PRF�19500 and as specified

herein.

4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In

case qualification was awarded to a prior revision of the specification sheet that did not require the performance of

table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on

the first inspection lot of this revision to maintain qualification.

4.2.2 Qualification of unencapsulated die (JANHC and JANKC devices). Qualification inspection for

unencapsulated die shall be in accordance with appendix G of MIL�PRF�19500. This qualification testing may be

performed with the die mounted in a TO�5 package in lieu of the DO�41 axial leaded package.