MIL�PRF�19500/586L
4.3.2 Screening of unencapsulated die (JANHC or JANKC). Screening of unencapsulated die shall be in
accordance with appendix G of MIL�PRF�19500 and as specified herein. Die shall be 100-percent probed in
accordance with table I, subgroup 2. Die that exceed the limits of table I herein shall not be acceptable.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL�PRF�19500, and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E�V of
MIL�PRF�19500 and table I herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table E�VIA (JANS), and E�VIB (JAN, JANTX, and JANTXV) of MIL�PRF�19500
and as follows herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
4.4.2.1 Quality level JANS (table E�VIA of MIL�PRF�19500).
Subgroup
Method
Conditions
0�C to +100�C, 25 cycles.
B3
1056
�55�C to +150�C, 100 cycles.
B3
1051
IFSM = 25 A (pk), condition A, IO = 1.0 A; TA = room ambient as defined in the
B3
4066
minute intervals.
Decap analysis; scribe and break only.
B3
2101
B3
2075
IF = 1.0 A; TA = room ambient as defined in the general requirements of
B4
1037
IF = 1 A dc (minimum), adjust IF or TA to achieve TJ = +125�C (minimum).
B5
1026
B6
4081
9
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