MILPRF19500/586L
4.3.2 Screening of unencapsulated die (JANHC or JANKC). Screening of unencapsulated die shall be in
accordance with appendix G of MILPRF19500 and as specified herein. Die shall be 100-percent probed in
accordance with table I, subgroup 2. Die that exceed the limits of table I herein shall not be acceptable.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MILPRF19500, and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table EV of
MILPRF19500 and table I herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table EVIA (JANS), and EVIB (JAN, JANTX, and JANTXV) of MILPRF19500
and as follows herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
4.4.2.1 Quality level JANS (table EVIA of MILPRF19500).
Subgroup
Method
Conditions
0°C to +100°C, 25 cycles.
B3
1056
55°C to +150°C, 100 cycles.
B3
1051
IFSM = 25 A (pk), condition A, IO = 1.0 A; TA = room ambient as defined in the
B3
4066
minute intervals.
Decap analysis; scribe and break only.
B3
2101
In accordance with 4.5.3.
B3
2075
IF = 1.0 A; TA = room ambient as defined in the general requirements of
B4
1037
IF = 1 A dc (minimum), adjust IF or TA to achieve TJ = +125°C (minimum).
B5
1026
B6
4081
See 4.3.1.3; RθJL and RθJEC only.
9
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business