MIL-PRF-19500/590K
3.4.2 Diode construction. These devices shall be constructed utilizing non-cavity double plug construction with
high temperature metallurgical bonding between both sides of the silicon die and terminal pins (see
MIL-PRF-19500). Metallurgical bond shall be in accordance with the requirements of category I in
MIL-PRF-19500. U and US version devices shall be structurally identical to the non-surface mount devices except for
lead terminations. The US version shall be structurally identical to the U version.
3.5 Marking. Marking shall be in accordance with MIL-PRF-19500.
3.5.1 Marking for U and US devices. For U and US version devices only, all marking may be omitted from the
device except for the cathode marking. All marking which is omitted from the body of the device shall appear on the
label of the initial container.
3.6 Polarity. The polarity of all types shall be indicated with a contrasting color band to denote the cathode end.
Alternatively, for U and US suffix devices, a minimum of three contrasting color dots spaced around the periphery on
the cathode end of the device may be used.
3.7 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance
3.8 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table I herein.
* 3.9 Workmanship. Semiconductor devices Diode, Silicon, Ultrafast Recovery, Power Rectifier shall be processed
in such a manner as to be uniform in quality and shall be free from other defects that will affect life, serviceability, or
appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified
herein.
4.2.1 Group E qualification. Group E qualification shall be performed herein for qualification or requalification only.
In case qualification was awarded to a prior revision of the specification sheet that did not request the performance of
table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on
the first inspection lot to this revision to maintain qualification.
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